Inventor

KUMAGAI JUNKO

JP2 patents

Patents

2 patents

US7178078B2Feb 13, 2007

Testing apparatus and testing method for an integrated circuit, and integrated circuit

FUJITSU LTD38 citations89

US7315997B2Jan 1, 2008

Method and apparatus for supporting designing of LSI, and computer product

FUJITSU LTD2 citations56