Inventor
THIRUNAVUKARASU SENTHIL ARASU
IN13 patents
⚠️ This page may combine multiple inventors who share the name “THIRUNAVUKARASU SENTHIL ARASU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
THIRUNAVUKARASU SENTHIL ARASU
6 patentsUS8429593B1Apr 23, 2013
Method and apparatus to use physical design information to detect IR drop prone test patterns
THIRUNAVUKARASU SENTHIL ARASU7 citations83
US8336019B1Dec 18, 2012
Method and apparatus to use physical design information to detect IR drop prone test patterns
THIRUNAVUKARASU SENTHIL ARASU5 citations72
US8286123B1Oct 9, 2012
Method and apparatus to use physical design information to detect IR drop prone test patterns
THIRUNAVUKARASU SENTHIL ARASU4 citations72
US8584074B1Nov 12, 2013
Testing to prescribe state capture by, and state retrieval from scan registers
THIRUNAVUKARASU SENTHIL ARASU2 citations61
US8438528B1May 7, 2013
Method and apparatus to use physical design information to detect IR drop prone test patterns
THIRUNAVUKARASU SENTHIL ARASU2 citations61
US8392868B1Mar 5, 2013
Method and apparatus to use physical design information to detect IR drop prone test patterns
THIRUNAVUKARASU SENTHIL ARASU2 citations61
CADENCE DESIGN SYSTEMS INC
4 patentsUS7877715B1Jan 25, 2011
Method and apparatus to use physical design information to detect IR drop prone test patterns
CADENCE DESIGN SYSTEMS INC18 citations92
US7886263B1Feb 8, 2011
Testing to prescribe state capture by, and state retrieval from scan registers
CADENCE DESIGN SYSTEMS INC9 citations83
US7944285B1May 17, 2011
Method and apparatus to detect manufacturing faults in power switches
CADENCE DESIGN SYSTEMS INC10 citations80
US8595681B1Nov 26, 2013
Method and apparatus to use physical design information to detect IR drop prone test patterns
CADENCE DESIGN SYSTEMS INC4 citations73
TEXAS INSTRUMENTS INC
3 patentsUS7277803B2Oct 2, 2007
Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests
TEXAS INSTRUMENTS INC11 citations83
US7555687B2Jun 30, 2009
Sequential scan technique for testing integrated circuits with reduced power, time and/or cost
TEXAS INSTRUMENTS INC3 citations62
US7596773B2Sep 29, 2009
Automating optimal placement of macro-blocks in the design of an integrated circuit
TEXAS INSTRUMENTS INC2 citations51