P

Inventor

HWANG JOON

US59 patents
⚠️ This page may combine multiple inventors who share the name “HWANG JOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HYUNDAI ELECTRONICS IND

15 patents
US5952134ASep 14, 1999

Method for measuring overlay accuracy

HYUNDAI ELECTRONICS IND55 citations96
US6063529AMay 16, 2000

Overlay accuracy measurement mark

HYUNDAI ELECTRONICS IND16 citations92
US5731109AMar 24, 1998

Pattern structure of photomask comprising a sawtooth pattern

HYUNDAI ELECTRONICS IND21 citations92
US5665495ASep 9, 1997

Method for fabricating a semiconductor with a photomask

HYUNDAI ELECTRONICS IND46 citations92
US5376482ADec 27, 1994

Photomask having alignment marks

HYUNDAI ELECTRONICS IND21 citations83
US5700700ADec 23, 1997

Transistor in a semiconductor device and method of making the same

HYUNDAI ELECTRONICS IND10 citations74
US5681771AOct 28, 1997

Method of manufacturing a LDD transistor in a semiconductor device

HYUNDAI ELECTRONICS IND8 citations74
US5557855ASep 24, 1996

Reticle

HYUNDAI ELECTRONICS IND14 citations74
US5523184AJun 4, 1996

Photomask for forming high resolution photoresist patterns

HYUNDAI ELECTRONICS IND8 citations70
US5616438AApr 1, 1997

Reticle and a method for measuring blind setting accuracy using the same

HYUNDAI ELECTRONICS IND2 citations63
US5578401ANov 26, 1996

Photomask for the measurement of resolution of exposure equipment

HYUNDAI ELECTRONICS IND5 citations63
US5563010AOct 8, 1996

Exposure mask

HYUNDAI ELECTRONICS IND2 citations63
US5552251ASep 3, 1996

Reticle and method for measuring rotation error of reticle by use of the reticle

HYUNDAI ELECTRONICS IND5 citations63
US5516605AMay 14, 1996

Photo mask provided with development rate measuring pattern and method for measuring development rate uniformity

HYUNDAI ELECTRONICS IND4 citations63
US5837403ANov 17, 1998

Photomask for removing the notching phenomenon

HYUNDAI ELECTRONICS IND1 citations52

DONGBU HITEK CO LTD

14 patents
US7675101B2Mar 9, 2010

Image sensor and manufacturing method thereof

DONGBU HITEK CO LTD18 citations92
US7582502B1Sep 1, 2009

Method for manufacturing back side illumination image sensor

DONGBU HITEK CO LTD24 citations92
US7999292B2Aug 16, 2011

Image sensor and manufacturing method thereof

DONGBU HITEK CO LTD7 citations84
US7883920B2Feb 8, 2011

Image sensor and method for manufacturing an image sensor

DONGBU HITEK CO LTD7 citations84
US7695995B2Apr 13, 2010

Image sensor and method of fabricating the same

DONGBU HITEK CO LTD10 citations84
US8044478B2Oct 25, 2011

Image sensor comprising a photodiode in a crystalline semiconductor layer and manufacturing method thereof

DONGBU HITEK CO LTD6 citations63
US7884391B2Feb 8, 2011

Image sensor and method for manufacturing the same

DONGBU HITEK CO LTD2 citations63
US7846761B2Dec 7, 2010

Image sensor and method for manufacturing the same

DONGBU HITEK CO LTD2 citations63
US7816714B2Oct 19, 2010

Image sensor including an image sensing device above a readout circuitry and method for manufacturing an image sensor

DONGBU HITEK CO LTD5 citations63
US7795065B2Sep 14, 2010

Image sensor and manufacturing method thereof

DONGBU HITEK CO LTD2 citations63
US7880196B2Feb 1, 2011

Image sensor and method for manufacturing the same

DONGBU HITEK CO LTD2 citations62
US8004027B2Aug 23, 2011

Image sensor and manufacturing method thereof

DONGBU HITEK CO LTD1 citations52
US7759156B2Jul 20, 2010

Image sensor and method for manufacturing the same

DONGBU HITEK CO LTD1 citations52
US7655545B2Feb 2, 2010

Image sensor and method of fabricating the same

DONGBU HITEK CO LTD1 citations52

GM GLOBAL TECH OPERATIONS LLC

9 patents

DONGBU ELECTRONICS CO LTD

7 patents

HYNIX SEMICONDUCTOR INC

2 patents

HWANG JOON

2 patents

GEN MOTORS LLC

1 patent

Showing the top 50 of 59 patents by PatentIndex Score.