Inventor
HWANG JOON
US59 patents
⚠️ This page may combine multiple inventors who share the name “HWANG JOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYUNDAI ELECTRONICS IND
15 patentsUS5952134ASep 14, 1999
Method for measuring overlay accuracy
HYUNDAI ELECTRONICS IND55 citations96
US6063529AMay 16, 2000
Overlay accuracy measurement mark
HYUNDAI ELECTRONICS IND16 citations92
US5731109AMar 24, 1998
Pattern structure of photomask comprising a sawtooth pattern
HYUNDAI ELECTRONICS IND21 citations92
US5665495ASep 9, 1997
Method for fabricating a semiconductor with a photomask
HYUNDAI ELECTRONICS IND46 citations92
US5376482ADec 27, 1994
Photomask having alignment marks
HYUNDAI ELECTRONICS IND21 citations83
US5700700ADec 23, 1997
Transistor in a semiconductor device and method of making the same
HYUNDAI ELECTRONICS IND10 citations74
US5681771AOct 28, 1997
Method of manufacturing a LDD transistor in a semiconductor device
HYUNDAI ELECTRONICS IND8 citations74
US5557855ASep 24, 1996
Reticle
HYUNDAI ELECTRONICS IND14 citations74
US5523184AJun 4, 1996
Photomask for forming high resolution photoresist patterns
HYUNDAI ELECTRONICS IND8 citations70
US5616438AApr 1, 1997
Reticle and a method for measuring blind setting accuracy using the same
HYUNDAI ELECTRONICS IND2 citations63
US5578401ANov 26, 1996
Photomask for the measurement of resolution of exposure equipment
HYUNDAI ELECTRONICS IND5 citations63
US5563010AOct 8, 1996
Exposure mask
HYUNDAI ELECTRONICS IND2 citations63
US5552251ASep 3, 1996
Reticle and method for measuring rotation error of reticle by use of the reticle
HYUNDAI ELECTRONICS IND5 citations63
US5516605AMay 14, 1996
Photo mask provided with development rate measuring pattern and method for measuring development rate uniformity
HYUNDAI ELECTRONICS IND4 citations63
US5837403ANov 17, 1998
Photomask for removing the notching phenomenon
HYUNDAI ELECTRONICS IND1 citations52
DONGBU HITEK CO LTD
14 patentsUS7675101B2Mar 9, 2010
Image sensor and manufacturing method thereof
DONGBU HITEK CO LTD18 citations92
US7582502B1Sep 1, 2009
Method for manufacturing back side illumination image sensor
DONGBU HITEK CO LTD24 citations92
US7999292B2Aug 16, 2011
Image sensor and manufacturing method thereof
DONGBU HITEK CO LTD7 citations84
US7883920B2Feb 8, 2011
Image sensor and method for manufacturing an image sensor
DONGBU HITEK CO LTD7 citations84
US7695995B2Apr 13, 2010
Image sensor and method of fabricating the same
DONGBU HITEK CO LTD10 citations84
US8044478B2Oct 25, 2011
Image sensor comprising a photodiode in a crystalline semiconductor layer and manufacturing method thereof
DONGBU HITEK CO LTD6 citations63
US7884391B2Feb 8, 2011
Image sensor and method for manufacturing the same
DONGBU HITEK CO LTD2 citations63
US7846761B2Dec 7, 2010
Image sensor and method for manufacturing the same
DONGBU HITEK CO LTD2 citations63
US7816714B2Oct 19, 2010
Image sensor including an image sensing device above a readout circuitry and method for manufacturing an image sensor
DONGBU HITEK CO LTD5 citations63
US7795065B2Sep 14, 2010
Image sensor and manufacturing method thereof
DONGBU HITEK CO LTD2 citations63
US7880196B2Feb 1, 2011
Image sensor and method for manufacturing the same
DONGBU HITEK CO LTD2 citations62
US8004027B2Aug 23, 2011
Image sensor and manufacturing method thereof
DONGBU HITEK CO LTD1 citations52
US7759156B2Jul 20, 2010
Image sensor and method for manufacturing the same
DONGBU HITEK CO LTD1 citations52
US7655545B2Feb 2, 2010
Image sensor and method of fabricating the same
DONGBU HITEK CO LTD1 citations52
GM GLOBAL TECH OPERATIONS LLC
9 patentsUS12270918B2Apr 8, 2025
Global positioning system bias detection and reduction
GM GLOBAL TECH OPERATIONS LLC0 citations62
US11386784B2Jul 12, 2022
Systems and methods for vehicle pose prediction
GM GLOBAL TECH OPERATIONS LLC0 citations53
US12222217B2Feb 11, 2025
Hill climbing algorithm for constructing a lane line map
GM GLOBAL TECH OPERATIONS LLC0 citations52
US12111176B2Oct 8, 2024
Lane line map construction using probability density bitmaps
GM GLOBAL TECH OPERATIONS LLC0 citations52
US9535129B2Jan 3, 2017
Systems and methods for estimating battery pack capacity during charge sustaining use
GM GLOBAL TECH OPERATIONS LLC1 citations52
US12480781B2Nov 25, 2025
Crowd-sourcing lane line maps for a vehicle
GM GLOBAL TECH OPERATIONS LLC0 citations51
US12467765B2Nov 11, 2025
System for fusing two or more versions of map data
GM GLOBAL TECH OPERATIONS LLC0 citations51
US12447997B2Oct 21, 2025
Merging lane line maps for a vehicle
GM GLOBAL TECH OPERATIONS LLC0 citations51
US12399032B2Aug 26, 2025
Method and system of inconsistent map data reconciliation in connected vehicles
GM GLOBAL TECH OPERATIONS LLC0 citations51
DONGBU ELECTRONICS CO LTD
7 patentsUS7488616B2Feb 10, 2009
CMOS image sensor and method for manufacturing the same
DONGBU ELECTRONICS CO LTD8 citations84
US7453110B2Nov 18, 2008
CMOS image sensor and method for manufacturing the same
DONGBU ELECTRONICS CO LTD12 citations84
US7279354B2Oct 9, 2007
Microlens of CMOS image sensor and method of manufacturing the same
DONGBU ELECTRONICS CO LTD12 citations84
US7268009B2Sep 11, 2007
Method for fabricating a CMOS image sensor
DONGBU ELECTRONICS CO LTD13 citations84
US7709871B2May 4, 2010
CMOS image sensor and method for manufacturing the same
DONGBU ELECTRONICS CO LTD4 citations63
US7560330B2Jul 14, 2009
CMOS image sensor and method for manufacturing the same
DONGBU ELECTRONICS CO LTD5 citations63
US7732746B2Jun 8, 2010
Image sensor and method of fabricating the same
DONGBU ELECTRONICS CO LTD0 citations52
HYNIX SEMICONDUCTOR INC
2 patentsHWANG JOON
2 patentsUS8178912B2May 15, 2012
Image sensor for minimizing a dark current and method for manufacturing the same
HWANG JOON5 citations62
US8339492B2Dec 25, 2012
Image sensor inhibiting electrical shorts in a contract plug penetrating an image sensing device and method for manufacturing the same
HWANG JOON1 citations51
GEN MOTORS LLC
1 patentShowing the top 50 of 59 patents by PatentIndex Score.