Inventor
SAKAMOTO HIRONORI
JP22 patents
⚠️ This page may combine multiple inventors who share the name “SAKAMOTO HIRONORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JAPAN RADIO CO LTD
10 patentsUS5327096AJul 5, 1994
Control circuit for automatically controlled feed forward nonlinear distortion compensation amplifier
JAPAN RADIO CO LTD27 citations92
US6489844B2Dec 3, 2002
Feed-forward amplifier and controller of the same
JAPAN RADIO CO LTD22 citations88
US6539202B1Mar 25, 2003
Interference canceling device
JAPAN RADIO CO LTD14 citations83
US7671684B2Mar 2, 2010
FET bias circuit
JAPAN RADIO CO LTD8 citations79
US5412342AMay 2, 1995
Power amplifier device comprising a plurality of feedforward distortion compensating circuits in parallel
JAPAN RADIO CO LTD15 citations74
US5363072ANov 8, 1994
High-frequency power divider-combiner
JAPAN RADIO CO LTD14 citations74
US6486724B2Nov 26, 2002
FET bias circuit
JAPAN RADIO CO LTD12 citations71
US5313657AMay 17, 1994
Receiver capable of reliably detecting a failure
JAPAN RADIO CO LTD15 citations69
US5394120AFeb 28, 1995
Device for testing an amplifier
JAPAN RADIO CO LTD6 citations59
US7948321B2May 24, 2011
FET bias circuit
JAPAN RADIO CO LTD4 citations58
NEC CORP
5 patentsUS6577993B1Jun 10, 2003
Method of extracting parameters of diffusion model capable of extracting the parameters quickly
NEC CORP7 citations73
US6212487B1Apr 3, 2001
Method and apparatus of establishing a region to be made amorphous
NEC CORP8 citations73
US6154718ANov 28, 2000
Method, apparatus and computer program product for simulating diffusion of impurities in a semiconductor
NEC CORP7 citations73
US6148276ANov 14, 2000
Diffusion simulating method
NEC CORP2 citations62
US6479874B2Nov 12, 2002
Semiconductor memory device having multilevel memory cell and method of manufacturing the same
NEC CORP2 citations61
SAKAMOTO HIRONORI
3 patentsUS8219963B2Jul 10, 2012
Method and apparatus for analyzing and designing semiconductor device using calculated surface potential
SAKAMOTO HIRONORI4 citations60
US8296700B2Oct 23, 2012
Analyzing method of semiconductor device, designing method thereof, and design supporting apparatus
SAKAMOTO HIRONORI0 citations39
US8250508B2Aug 21, 2012
Method and apparatus for analysis and design of a semiconductor device using impurity concentration distribution
SAKAMOTO HIRONORI0 citations39