Inventor
AKAMA YOSHIAKI
JP5 patents
Patents
5 patentsUS6541287B2Apr 1, 2003
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers
TOSHIBA KK24 citations89
US5679960AOct 21, 1997
Compact display device
TOSHIBA KK22 citations89
US5903092AMay 11, 1999
Device for emitting electrons
TOSHIBA KK18 citations81
US6780657B2Aug 24, 2004
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers
TOSHIBA KK14 citations80
US5509843AApr 23, 1996
Method and apparatus for manufacturing needle shaped materials and method for manufacturing a microemitter
TOSHIBA KK8 citations71