Inventor
ABE TSUNEO
JP15 patents
⚠️ This page may combine multiple inventors who share the name “ABE TSUNEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ELPIDA MEMORY INC
8 patentsUS7932759B2Apr 26, 2011
DLL circuit and control method therefor
ELPIDA MEMORY INC10 citations83
US7830189B2Nov 9, 2010
DLL circuit and control method therefor
ELPIDA MEMORY INC15 citations83
US7755401B2Jul 13, 2010
Semiconductor device including DLL circuit, and data processing system
ELPIDA MEMORY INC8 citations83
US7050920B2May 23, 2006
Semiconductor device having a test circuit for testing an output circuit
ELPIDA MEMORY INC14 citations83
US7449931B2Nov 11, 2008
Duty ratio adjustment
ELPIDA MEMORY INC2 citations61
US6999889B2Feb 14, 2006
Semiconductor device having a test circuit for testing an output circuit
ELPIDA MEMORY INC4 citations61
US7644325B2Jan 5, 2010
Semiconductor integrated circuit device and method of testing the same
ELPIDA MEMORY INC0 citations51
US7796447B2Sep 14, 2010
Semiconductor memory device having output impedance adjustment circuit and test method of output impedance
ELPIDA MEMORY INC0 citations40
MICRON TECHNOLOGY INC
5 patentsUS11120855B2Sep 14, 2021
Semiconductor device including a clock adjustment circuit
MICRON TECHNOLOGY INC1 citations72
US10388341B2Aug 20, 2019
Semiconductor device including a clock adjustment circuit
MICRON TECHNOLOGY INC1 citations72
US10181343B2Jan 15, 2019
Semiconductor device including a clock adjustment circuit
MICRON TECHNOLOGY INC2 citations72
US9875778B2Jan 23, 2018
Semiconductor device including a clock adjustment circuit
MICRON TECHNOLOGY INC3 citations72
US11555828B2Jan 17, 2023
Testing probe system for testing semiconductor die, multi-channel die having shared pads, and related systems and methods
MICRON TECHNOLOGY INC0 citations41