Inventor
STAWIASZ KEVIN G
US7 patents
⚠️ This page may combine multiple inventors who share the name “STAWIASZ KEVIN G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
6 patentsUS10102090B2Oct 16, 2018
Non-destructive analysis to determine use history of processor
IBM2 citations71
US9791499B2Oct 17, 2017
Circuit to detect previous use of computer chips using passive test wires
IBM3 citations71
US10552278B2Feb 4, 2020
Non-destructive analysis to determine use history of processor
IBM0 citations51
US9791500B2Oct 17, 2017
Circuit to detect previous use of computer chips using passive test wires
IBM0 citations51
US7768848B2Aug 3, 2010
On-chip characterization of noise-margins for memory arrays
IBM0 citations50
US11105856B2Aug 31, 2021
Detection of performance degradation in integrated circuits
IBM0 citations48