Inventor
NOZAKI TAKEO
JP9 patents
⚠️ This page may combine multiple inventors who share the name “NOZAKI TAKEO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
7 patentsUS6504947B1Jan 7, 2003
Method and apparatus for multi-level rounding and pattern inspection
NEC CORP46 citations91
US6040911AMar 21, 2000
Reference image forming method and pattern inspection apparatus
NEC CORP53 citations91
US7239735B2Jul 3, 2007
Pattern inspection method and pattern inspection device
NEC CORP35 citations90
US11207003B2Dec 28, 2021
Walking state determination device, walking state determination system, walking state determination method, and storage medium
NEC CORP2 citations72
US11375924B2Jul 5, 2022
Walking state measurement device, walking state measurement system, walking state measurement method, and storage medium for storing walking state measurement program
NEC CORP0 citations61
US10776945B2Sep 15, 2020
Dimension measurement device, dimension measurement system, and dimension measurement method
NEC CORP1 citations60
US10048658B2Aug 14, 2018
Information processing device, predictive control method, and recording medium
NEC CORP1 citations50