P

Inventor

JABER TALAL K

US6 patents
⚠️ This page may combine multiple inventors who share the name “JABER TALAL K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

4 patents
US6815977B2Nov 9, 2004

Scan cell systems and methods

INTEL CORP55 citations90
US7437634B2Oct 14, 2008

Test scan cells

INTEL CORP16 citations81
US7028239B2Apr 11, 2006

Microprocessor on-chip testing architecture and implementation

INTEL CORP16 citations81
US7216274B2May 8, 2007

Flexible scan architecture

INTEL CORP3 citations57

IBM

1 patent
US5614838AMar 25, 1997

Reduced power apparatus and method for testing high speed components

IBM91 citations92

JABER TALAL K

1 patent
US8321730B2Nov 27, 2012

Scan architecture and design methodology yielding significant reduction in scan area and power overhead

JABER TALAL K0 citations43