Inventor
AHN BYOUNG WOON
KR6 patents
⚠️ This page may combine multiple inventors who share the name “AHN BYOUNG WOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PARK SYSTEMS CORP
5 patentsUS12038455B2Jul 16, 2024
Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source
PARK SYSTEMS CORP0 citations55
US11598788B2Mar 7, 2023
Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source
PARK SYSTEMS CORP0 citations55
US12399195B2Aug 26, 2025
Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method
PARK SYSTEMS CORP0 citations51
US11619649B1Apr 4, 2023
Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same
PARK SYSTEMS CORP0 citations44
US9645168B2May 9, 2017
Head limiting movement range of laser spot and atomic force microscope having the same
PARK SYSTEMS CORP0 citations44