Inventor

CHUNG SANG HAN

KR5 patents

⚠️ This page may combine multiple inventors who share the name “CHUNG SANG HAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PARK SYSTEMS CORP

4 patents

US7644447B2Jan 5, 2010

Scanning probe microscope capable of measuring samples having overhang structure

PARK SYSTEMS CORP7 citations69

US9645168B2May 9, 2017

Head limiting movement range of laser spot and atomic force microscope having the same

PARK SYSTEMS CORP0 citations44

US9645169B2May 9, 2017

Measurement apparatus and method with adaptive scan rate

PARK SYSTEMS CORP0 citations36

US10133052B2Nov 20, 2018

Image acquiring method and image acquiring apparatus using the same

PARK SYSTEMS CORP0 citations31

PARK SANG-IL

1 patent

US8209766B2Jun 26, 2012

Scanning probe microscope capable of measuring samples having overhang structure

PARK SANG-IL1 citations48