Inventor
KIKUCHI KATSUYA
JP31 patents
⚠️ This page may combine multiple inventors who share the name “KIKUCHI KATSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
11 patentsUS5045935ASep 3, 1991
Electronic endoscope system including image processing unit with photographing unit
TOSHIBA KK67 citations96
US4998973AMar 12, 1991
Endoscope
TOSHIBA KK55 citations96
US4819077AApr 4, 1989
Color image processing system
TOSHIBA KK92 citations96
US4947246AAug 7, 1990
Color endoscope apparatus including color lighting control
TOSHIBA KK50 citations92
US4712133ADec 8, 1987
Endoscopic apparatus
TOSHIBA KK26 citations92
US4656650AApr 7, 1987
X-ray diagnostic apparatus for eliminating scattered X-ray components
TOSHIBA KK25 citations92
US5331949AJul 26, 1994
Endoscope having illuminance ratio adjusting device between moving and still picture images
TOSHIBA KK29 citations89
US4823370AApr 18, 1989
X-ray diagnostic apparatus
TOSHIBA KK21 citations82
US5045934ASep 3, 1991
Electronic endoscope apparatus capable of indicating over-exposure area on functional image
TOSHIBA KK12 citations74
US5007407AApr 16, 1991
Endoscope having picture image freeze device
TOSHIBA KK12 citations74
US4741009AApr 26, 1988
X-ray diagnostic apparatus for analyzing scattered X-rays by using X-ray shield member
TOSHIBA KK13 citations74
NAT INST OF ADVANCED IND SCIEN
5 patentsUS7990165B2Aug 2, 2011
Contact probe and method of making the same
NAT INST OF ADVANCED IND SCIEN10 citations82
US7323348B2Jan 29, 2008
Superconducting integrated circuit and method for fabrication thereof
NAT INST OF ADVANCED IND SCIEN7 citations72
US8367468B2Feb 5, 2013
Electrode connection structure of semiconductor chip, conductive member, and semiconductor device and method for manufacturing the same
NAT INST OF ADVANCED IND SCIEN3 citations62
US7833835B2Nov 16, 2010
Multi-layer fin wiring interposer fabrication process
NAT INST OF ADVANCED IND SCIEN3 citations62
US7414422B2Aug 19, 2008
System in-package test inspection apparatus and test inspection method
NAT INST OF ADVANCED IND SCIEN2 citations62
TOKYO SHIBAURA ELECTRIC CO
3 patentsUS4653080AMar 24, 1987
X-ray diagnostic apparatus
TOKYO SHIBAURA ELECTRIC CO8 citations74
US4618928AOct 21, 1986
Data processing apparatus for producing X-ray images with improved signal to noise ratio
TOKYO SHIBAURA ELECTRIC CO7 citations74
US4599742AJul 8, 1986
X-ray diagnostic apparatus
TOKYO SHIBAURA ELECTRIC CO12 citations74
AIST
3 patentsUS9818645B2Nov 14, 2017
Through electrode, manufacturing method thereof, and semiconductor device and manufacturing method thereof
AIST2 citations70
US9984956B2May 29, 2018
Through electrode, manufacturing method thereof, and semiconductor device and manufacturing method thereof
AIST0 citations48
US11270968B2Mar 8, 2022
Electronic circuit connection method and electronic circuit
AIST0 citations44
KIYOTA MFG CO
2 patentsUS7227352B2Jun 5, 2007
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe
KIYOTA MFG CO5 citations70
US7208966B2Apr 24, 2007
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe
KIYOTA MFG CO7 citations70