P

Inventor

WANG MING-YIH

TW28 patents
⚠️ This page may combine multiple inventors who share the name “WANG MING-YIH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

26 patents
US11199508B1Dec 14, 2021

Failure analysis method with improved detection accuracy for advanced technology node

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations72
US11094702B1Aug 17, 2021

One-time programmable memory device including anti-fuse element and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10957664B2Mar 23, 2021

Semiconductor structure and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10707179B1Jul 7, 2020

Semiconductor structure and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US11616002B2Mar 28, 2023

Through-circuit vias in interconnect structures

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10726191B2Jul 28, 2020

Method and system for manufacturing a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US9780106B2Oct 3, 2017

Two-transistor non-volatile memory cell and related program and read methods

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations69
US12014997B2Jun 18, 2024

Dummy stacked structures surrounding TSVs and method forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations68
US12007438B2Jun 11, 2024

Method and system for testing an integrated circuit

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11579191B2Feb 14, 2023

Method and system for testing an integrated circuit

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12293959B2May 6, 2025

Through-circuit Vias in interconnect structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12243805B2Mar 4, 2025

Through-circuit vias in interconnect structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12131992B2Oct 29, 2024

Semiconductor structure and method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11963347B2Apr 16, 2024

One-time programmable memory device including anti-fuse element

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11830832B2Nov 28, 2023

Semiconductor structure and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11830806B2Nov 28, 2023

Semiconductor structure and method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11665890B2May 30, 2023

One-time programmable memory device including anti-fuse element and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11309258B2Apr 19, 2022

Semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12248022B2Mar 11, 2025

Method and apparatus for detecting defective logic devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11361141B2Jun 14, 2022

Method and system for manufacturing a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations59
US12456696B2Oct 28, 2025

Dummy stacked structures surrounding TSVs and method forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US11852682B2Dec 26, 2023

Circuit screening system and circuit screening method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US11500016B2Nov 15, 2022

Circuit screening system and circuit screening method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12536357B2Jan 27, 2026

Systems and methods for modeling via defect

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10868185B2Dec 15, 2020

Semiconductor structure and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US11675004B2Jun 13, 2023

Method and apparatus for detecting defective logic devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49

TAIWAN SEMICONDUCTOR MFG

1 patent

ASUSTEK COMP INC

1 patent