Inventor
WANG MING-YIH
TW28 patents
⚠️ This page may combine multiple inventors who share the name “WANG MING-YIH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
26 patentsUS11199508B1Dec 14, 2021
Failure analysis method with improved detection accuracy for advanced technology node
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations72
US11094702B1Aug 17, 2021
One-time programmable memory device including anti-fuse element and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10957664B2Mar 23, 2021
Semiconductor structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10707179B1Jul 7, 2020
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US11616002B2Mar 28, 2023
Through-circuit vias in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10726191B2Jul 28, 2020
Method and system for manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US9780106B2Oct 3, 2017
Two-transistor non-volatile memory cell and related program and read methods
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations69
US12014997B2Jun 18, 2024
Dummy stacked structures surrounding TSVs and method forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations68
US12007438B2Jun 11, 2024
Method and system for testing an integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11579191B2Feb 14, 2023
Method and system for testing an integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12293959B2May 6, 2025
Through-circuit Vias in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12243805B2Mar 4, 2025
Through-circuit vias in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12131992B2Oct 29, 2024
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11963347B2Apr 16, 2024
One-time programmable memory device including anti-fuse element
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11830832B2Nov 28, 2023
Semiconductor structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11830806B2Nov 28, 2023
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11665890B2May 30, 2023
One-time programmable memory device including anti-fuse element and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11309258B2Apr 19, 2022
Semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12248022B2Mar 11, 2025
Method and apparatus for detecting defective logic devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11361141B2Jun 14, 2022
Method and system for manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations59
US12456696B2Oct 28, 2025
Dummy stacked structures surrounding TSVs and method forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US11852682B2Dec 26, 2023
Circuit screening system and circuit screening method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US11500016B2Nov 15, 2022
Circuit screening system and circuit screening method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12536357B2Jan 27, 2026
Systems and methods for modeling via defect
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10868185B2Dec 15, 2020
Semiconductor structure and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US11675004B2Jun 13, 2023
Method and apparatus for detecting defective logic devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49