Inventor
ADAN OFER
IL10 patents
⚠️ This page may combine multiple inventors who share the name “ADAN OFER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
9 patentsUS10354376B2Jul 16, 2019
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD5 citations80
US9530199B1Dec 27, 2016
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD12 citations80
US10049904B1Aug 14, 2018
Method and system for moving a substrate
APPLIED MATERIALS ISRAEL LTD6 citations69
US9916652B2Mar 13, 2018
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD2 citations69
US10957567B2Mar 23, 2021
Method, computer program product and system for detecting manufacturing process defects
APPLIED MATERIALS ISRAEL LTD0 citations60
US12250503B2Mar 11, 2025
Prediction of electrical properties of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations49
US9835563B2Dec 5, 2017
Evaluation system and a method for evaluating a substrate
APPLIED MATERIALS ISRAEL LTD0 citations49
US9383196B2Jul 5, 2016
System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensions
APPLIED MATERIALS ISRAEL LTD0 citations41
US9297692B2Mar 29, 2016
System and method for inspecting a sample using landing lens
APPLIED MATERIALS ISRAEL LTD0 citations41