Inventor
NAKANO AKIHIKO
JP17 patents
⚠️ This page may combine multiple inventors who share the name “NAKANO AKIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHARP KK
8 patentsUS5089774AFeb 18, 1992
Apparatus and a method for checking a semiconductor
SHARP KK212 citations98
US5132507AJul 21, 1992
Apparatus and a method for checking a semiconductor
SHARP KK43 citations92
US6545371B1Apr 8, 2003
Semiconductor device wherein detection of removal of wiring triggers impairing of normal operation of internal circuit
SHARP KK11 citations71
US6472730B1Oct 29, 2002
Semiconductor device and method of manufacturing the same
SHARP KK10 citations71
US5336895AAug 9, 1994
Impurity free reference grid for use charged partiole beam spectroscopes
SHARP KK6 citations62
US5301002AApr 5, 1994
Apparatus for inspecting a semiconductor device
SHARP KK3 citations62
US6005248ADec 21, 1999
Method for observing a reaction process by transmission electron microscopy
SHARP KK4 citations56
US6759722B2Jul 6, 2004
Semiconductor device and method of manufacturing the same
SHARP KK0 citations50