Inventor
YOO SANG-KYU
KR3 patents
Patents
3 patentsUS7605596B2Oct 20, 2009
Probe card, apparatus and method for inspecting an object
SAMSUNG ELECTRONICS CO LTD5 citations57
US10295564B2May 21, 2019
Apparatus for clamping a probe card and probe card including the same
SAMSUNG ELECTRONICS CO LTD0 citations48
US7701235B2Apr 20, 2010
Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the same
SAMSUNG ELECTRONICS CO LTD0 citations39