Inventor
FUJII YOSHIKI
JP13 patents
⚠️ This page may combine multiple inventors who share the name “FUJII YOSHIKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMRON TATEISI ELECTRONICS CO
6 patentsUS7356176B2Apr 8, 2008
Mounting-error inspecting method and substrate inspecting apparatus using the method
OMRON TATEISI ELECTRONICS CO20 citations92
US6947151B2Sep 20, 2005
Surface state inspecting method and substrate inspecting apparatus
OMRON TATEISI ELECTRONICS CO34 citations91
US7062080B2Jun 13, 2006
Method of inspecting curved surface and device for inspecting printed circuit board
OMRON TATEISI ELECTRONICS CO9 citations65
US7406191B2Jul 29, 2008
Inspection data producing method and board inspection apparatus using the method
OMRON TATEISI ELECTRONICS CO6 citations62
US7961933B2Jun 14, 2011
Method of setting reference data for inspection of fillets and inspection device using same
OMRON TATEISI ELECTRONICS CO5 citations57
US7672501B2Mar 2, 2010
Substrate inspection system including a visual inspection device for inspection by image processing
OMRON TATEISI ELECTRONICS CO4 citations54