Inventor
SANO KUNIO
JP28 patents
⚠️ This page may combine multiple inventors who share the name “SANO KUNIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIPPON CATALYTIC CHEM IND
13 patentsUS5192452AMar 9, 1993
Catalyst for water treatment
NIPPON CATALYTIC CHEM IND70 citations96
US4751005AJun 14, 1988
Method for treatment of waste water
NIPPON CATALYTIC CHEM IND76 citations95
US5145587ASep 8, 1992
Method for treatment of waste water
NIPPON CATALYTIC CHEM IND45 citations92
US5620610AApr 15, 1997
Catalyst for treating wastewater, process for producing it, and process for treating wastewater with the catalyst
NIPPON CATALYTIC CHEM IND24 citations91
US5399541AMar 21, 1995
Catalyst for treating wastewater
NIPPON CATALYTIC CHEM IND38 citations91
US5374599ADec 20, 1994
Catalyst for treating wastewater, process for producing it, and process for treating wastewater with the catalyst
NIPPON CATALYTIC CHEM IND25 citations91
US5145657ASep 8, 1992
Method for purification of gas
NIPPON CATALYTIC CHEM IND50 citations91
US4418045ANov 29, 1983
Method for disposal of waste gas and apparatus therefor
NIPPON CATALYTIC CHEM IND33 citations91
US6051198AApr 18, 2000
Catalyst for purifying fumigation exhaust gases and a method of purifying fumigation exhaust gases
NIPPON CATALYTIC CHEM IND20 citations89
US5472676ADec 5, 1995
Method of deodorizing a gas containing maloderous components
NIPPON CATALYTIC CHEM IND18 citations73
US5158689AOct 27, 1992
Method for purification of waste water
NIPPON CATALYTIC CHEM IND16 citations73
US4939260AJul 3, 1990
Process for producing aromatic nitriles or heterocyclic nitriles
NIPPON CATALYTIC CHEM IND17 citations72
US4957717ASep 18, 1990
Method of disposal of organic chlorine compounds by combustion
NIPPON CATALYTIC CHEM IND9 citations71
TOKYO ELECTRON LTD
10 patentsUS5550482AAug 27, 1996
Probe device
TOKYO ELECTRON LTD153 citations99
US5604446AFeb 18, 1997
Probe apparatus
TOKYO ELECTRON LTD101 citations98
US5999268ADec 7, 1999
Apparatus for aligning a semiconductor wafer with an inspection contactor
TOKYO ELECTRON LTD146 citations97
US6084419AJul 4, 2000
Method and apparatus for inspecting semiconductor integrated circuits, and contactor incorporated in the apparatus
TOKYO ELECTRON LTD57 citations96
US5778485AJul 14, 1998
Probe card cleaning apparatus, probe apparatus with the cleaning apparatus, and probe card cleaning method
TOKYO ELECTRON LTD55 citations96
US5703494ADec 30, 1997
Probing test apparatus
TOKYO ELECTRON LTD63 citations96
US5559446ASep 24, 1996
Probing method and device
TOKYO ELECTRON LTD73 citations96
US6072325AJun 6, 2000
Probe device
TOKYO ELECTRON LTD29 citations92
US5982183ANov 9, 1999
Probing method and device with contact film wiper feature
TOKYO ELECTRON LTD39 citations92
US5748006AMay 5, 1998
High-frequency-transmission printed wiring board, probe card, and probe apparatus
TOKYO ELECTRON LTD33 citations92