Inventor

ALONI MEIR

IL17 patents

⚠️ This page may combine multiple inventors who share the name “ALONI MEIR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ALONI MEIR

ORBOT INSTR LTD

Apparatus and method for inspection of a patterned object by comparison thereof to a reference

Apparatus and method for inspection of a patterned object by comparison thereof to a reference

Apparatus and method for comparing and aligning two digital representations of an image

Apparatus and method for comparing and aligning two digital representations of an image

APPLIED MATERIALS ISRAEL LTD

High resolution printer and a method for high resolution printing

Raster frame beam system for electron beam lithography

Raster frame beam system for electron beam lithography

Printer and a method for recording a multi-level image

APPLIED MATERIALS INC

Apparatus and method for microscopic inspection of articles

Data converter apparatus and method particularly useful for a database-to-object inspection system

Raster frame beam system for electron beam lithography

KLA TENCOR CORP

Symmetric target design in scatterometry overlay metrology

Symmetric target design in scatterometry overlay metrology

Phase characterization of targets

COMVIEW GRAPHICS LTD

Electro-optical display apparatus

Light sampling devices and projector system including same

APPLIED MATERIALS ISREAL LTD

Printer and a method for recording a multi-level image