Inventor
KEANE JOHN P
US9 patents
⚠️ This page may combine multiple inventors who share the name “KEANE JOHN P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
4 patentsUS7949482B2May 24, 2011
Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery
IBM13 citations84
US7548823B2Jun 16, 2009
Correction of delay-based metric measurements using delay circuits having differing metric sensitivities
IBM17 citations83
US7542862B2Jun 2, 2009
Calibration of multi-metric sensitive delay measurement circuits
IBM11 citations83
US7881135B2Feb 1, 2011
Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit
IBM4 citations62