Inventor
HANASHI TAKUYA
JP9 patents
Patents
9 patentsUS9188535B2Nov 17, 2015
Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis
OLYMPUS CORP10 citations81
US9395357B2Jul 19, 2016
Method of detecting sparse particles in a solution using a light-emitting probe
OLYMPUS CORP4 citations71
US9841418B2Dec 12, 2017
Method for detecting target particle
OLYMPUS CORP2 citations70
US9575060B2Feb 21, 2017
Method for detecting a target particle
OLYMPUS CORP5 citations70
US9488578B2Nov 8, 2016
Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis
OLYMPUS CORP1 citations51
US11016026B2May 25, 2021
Optical analysis method and optical analysis device using single light-emitting particle detection
OLYMPUS CORP0 citations50
US8958066B2Feb 17, 2015
Optical analysis method using measurement of light of two or more wavelength bands
OLYMPUS CORP0 citations50
US9435727B2Sep 6, 2016
Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
OLYMPUS CORP0 citations40
US9103718B2Aug 11, 2015
Optical analysis device and optical analysis method using a wavelength characteristic of light of a single light-emitting particle
OLYMPUS CORP0 citations40