P

Inventor

YAMAGUCHI MITSUSHIRO

JP15 patents
⚠️ This page may combine multiple inventors who share the name “YAMAGUCHI MITSUSHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OLYMPUS CORP

12 patents
US9423349B2Aug 23, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP3 citations72
US9329117B2May 3, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP6 citations72
US8803106B2Aug 12, 2014

Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particle

OLYMPUS CORP3 citations62
US8681332B2Mar 25, 2014

Method of measuring a diffusion characteristic value of a particle

OLYMPUS CORP3 citations62
US8785886B2Jul 22, 2014

Optical analysis method using the light intensity of a single light-emitting particle

OLYMPUS CORP3 citations61
US11119022B2Sep 14, 2021

Optical analysis device, optical analysis method, and recording medium

OLYMPUS CORP0 citations51
US8958066B2Feb 17, 2015

Optical analysis method using measurement of light of two or more wavelength bands

OLYMPUS CORP0 citations50
US10371631B2Aug 6, 2019

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP0 citations41
US10310245B2Jun 4, 2019

Optical microscope device, microscopic observation method and computer program for microscopic observation using single light-emitting particle detection technique

OLYMPUS CORP0 citations41
US9797839B2Oct 24, 2017

System for applying phantom sample to evaluate optical analysis device, storage device storing instructions, method and phantom sample

OLYMPUS CORP0 citations40
US9435727B2Sep 6, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP0 citations40
US9103718B2Aug 11, 2015

Optical analysis device and optical analysis method using a wavelength characteristic of light of a single light-emitting particle

OLYMPUS CORP0 citations40

YAMAGUCHI MITSUSHIRO

3 patents