Inventor
LAREDO GILAD
IL12 patents
⚠️ This page may combine multiple inventors who share the name “LAREDO GILAD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA CORP
11 patentsUS11073768B2Jul 27, 2021
Metrology target for scanning metrology
KLA CORP19 citations94
US11573497B2Feb 7, 2023
System and method for measuring misregistration of semiconductor device wafers utilizing induced topography
KLA CORP5 citations85
US11346657B2May 31, 2022
Measurement modes for overlay
KLA CORP7 citations85
US11899375B2Feb 13, 2024
Massive overlay metrology sampling with multiple measurement columns
KLA CORP2 citations72
US11281112B2Mar 22, 2022
Method of measuring misregistration in the manufacture of topographic semiconductor device wafers
KLA CORP2 citations72
US12560871B2Feb 24, 2026
Metrology target for scanning metrology
KLA CORP0 citations62
US11880141B2Jan 23, 2024
Method of measuring misregistration in the manufacture of topographic semiconductor device wafers
KLA CORP0 citations62
US12379669B2Aug 5, 2025
Massive overlay metrology sampling with multiple measurement columns
KLA CORP0 citations61
US11933717B2Mar 19, 2024
Sensitive optical metrology in scanning and static modes
KLA CORP0 citations51
US11512948B2Nov 29, 2022
Imaging system for buried metrology targets
KLA CORP0 citations51
US11333616B2May 17, 2022
Adaptive focusing system for a scanning metrology tool
KLA CORP0 citations50