Inventor

SHIN YOUNG-GU

KR3 patents

Patents

3 patents

US6943577B2Sep 13, 2005

Multichip package test

SAMSUNG ELECTRONICS CO LTD6 citations70

US7327154B2Feb 5, 2008

Multichip package test

SAMSUNG ELECTRONICS CO LTD3 citations59

US7012443B2Mar 14, 2006

System used to test plurality of DUTs in parallel and method thereof

SAMSUNG ELECTRONICS CO LTD1 citations43