Inventor
LEE HYOUNG-YOUNG
KR5 patents
⚠️ This page may combine multiple inventors who share the name “LEE HYOUNG-YOUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
4 patentsUS7227351B2Jun 5, 2007
Apparatus and method for performing parallel test on integrated circuit devices
SAMSUNG ELECTRONICS CO LTD11 citations80
US6943577B2Sep 13, 2005
Multichip package test
SAMSUNG ELECTRONICS CO LTD6 citations70
US7327154B2Feb 5, 2008
Multichip package test
SAMSUNG ELECTRONICS CO LTD3 citations59
US9285415B2Mar 15, 2016
Built-off test device and test system including the same
SAMSUNG ELECTRONICS CO LTD0 citations44