Inventor
JU KI-BONG
KR4 patents
Patents
4 patentsUS6199185B1Mar 6, 2001
Test method for high speed semiconductor devices using a clock modulation technique
SAMSUNG ELECTRONICS CO LTD19 citations81
US7227351B2Jun 5, 2007
Apparatus and method for performing parallel test on integrated circuit devices
SAMSUNG ELECTRONICS CO LTD11 citations80
US6943577B2Sep 13, 2005
Multichip package test
SAMSUNG ELECTRONICS CO LTD6 citations70
US7327154B2Feb 5, 2008
Multichip package test
SAMSUNG ELECTRONICS CO LTD3 citations59