Inventor

WATANABE TETSUYA

JP221 patents

⚠️ This page may combine multiple inventors who share the name “WATANABE TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WATANABE TETSUYA

HITACHI LTD

Optical apparatus for defect and particle size inspection

Workflow server and workflow system control method

Method and its apparatus for inspecting particles or defects of a semiconductor device

System for controlling communications between an application and a remote system using a protocol identifier and an application context identifier

System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value

Method of inspecting a semiconductor device and an apparatus thereof

Method and its apparatus for inspecting particles or defects of a semiconductor device

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method for inspecting defects

Apparatus and method for inspecting defects

Apparatus and method of inspecting foreign particle or defect on a sample

Multiserver workflow system

YOKOGAWA ELECTRIC CORP

Vibratory transducer

Semiconductor differential pressure measuring device

Vibrating type transducer

Process for manufacturing a vibrating type transducer

Oscillator using H-shaped single crystal silicon vibrator

Vibrating type pressure measuring device

HITACHI ELECTR ENG

Surface inspection method and apparatus

Surface defect inspection device and shading correction method therefor

Extraneous substance inspection apparatus for patterned wafer

Extraneous substance inspection method and apparatus

Inspecting method and apparatus for repeated micro-miniature patterns

HITACHI HIGH TECH CORP

Apparatus and method for testing defects

Apparatus and method for testing defects

Method of inspecting a semiconductor device and an apparatus thereof

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

TEIJIN SEIKI CO LTD

Shaft sealing assembly for vacuum processing apparatus

Shaft sealing apparatus

Robot arm mechanism

MITSUBISHI MOTORS CORP

Exhaust gas purifying catalyst

Exhaust emission control device of internal combustion engine

Exhaust emission control device for internal combustion engine

MITSUBISHI ELECTRIC CORP

Semiconductor device

Semiconductor integrated circuit with well potential control circuit

NAKAMURA BRACE CO LTD

Method of making positive and negative models for artificial breasts

Patella brace

HITACHI HIGH TECH ELECT ENG CO

Method of inspecting a semiconductor device and an apparatus thereof

FUJI PHOTO FILM CO LTD

Semiconductor particle sensitized with methine dye

NAKAMURA TOSHIRO

Insole

RENESAS TECH CORP

Static type semiconductor memory device with dummy memory cell

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Capacitance measurement circuit

KUREHA CHEMICAL IND CO LTD

An absorbing solution for the removal of nitrogen oxide form a gas containing same

SONY COMPUTER ENTERTAINMENT INC

Augmented reality game system using identification information to display a virtual object in association with a position of a real object

SANYO CHEMICAL IND LTD

Photosensitive composition and use thereof

ISHIMORI YUSAKU

Screw member with elastically deformable features

PIONEER ELECTRONIC CORP

Heat sink/circuit board assembly

NIHON DEMPA KOGYO CO

Crystal unit and manufacturing method thereof