Inventor
BEINTNER JOCHEN
US63 patents
⚠️ This page may combine multiple inventors who share the name “BEINTNER JOCHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
27 patentsUS7683428B2Mar 23, 2010
Vertical Fin-FET MOS devices
IBM221 citations99
US7470570B2Dec 30, 2008
Process for fabrication of FinFETs
IBM138 citations99
US7091566B2Aug 15, 2006
Dual gate FinFet
IBM69 citations98
US7410844B2Aug 12, 2008
Device fabrication by anisotropic wet etch
IBM53 citations96
US7348641B2Mar 25, 2008
Structure and method of making double-gated self-aligned finFET having gates of different lengths
IBM18 citations93
US7323374B2Jan 29, 2008
Dense chevron finFET and method of manufacturing same
IBM22 citations93
US7087952B2Aug 8, 2006
Dual function FinFET, finmemory and method of manufacture
IBM27 citations93
US7037794B2May 2, 2006
Raised STI process for multiple gate ox and sidewall protection on strained Si/SGOI structure with elevated source/drain
IBM18 citations93
US6998666B2Feb 14, 2006
Nitrided STI liner oxide for reduced corner device impact on vertical device performance
IBM46 citations93
US6566228B1May 20, 2003
Trench isolation processes using polysilicon-assisted fill
IBM40 citations93
US6746933B1Jun 8, 2004
Pitcher-shaped active area for field effect transistor and method of forming same
IBM35 citations92
US6607984B1Aug 19, 2003
Removable inorganic anti-reflection coating process
IBM42 citations92
US7737502B2Jun 15, 2010
Raised STI process for multiple gate ox and sidewall protection on strained Si/SGOI sructure with elevated source/drain
IBM12 citations84
US6620676B2Sep 16, 2003
Structure and methods for process integration in vertical DRAM cell fabrication
IBM14 citations84
US6579759B1Jun 17, 2003
Formation of self-aligned buried strap connector
IBM19 citations84
US7346887B2Mar 18, 2008
Method for fabricating integrated circuit features
IBM7 citations74
US6790739B2Sep 14, 2004
Structure and methods for process integration in vertical DRAM cell fabrication
IBM11 citations74
US6667504B1Dec 23, 2003
Self-aligned buried strap process using doped HDP oxide
IBM11 citations74
US6369419B1Apr 9, 2002
Self-aligned near surface strap for high density trench DRAMS
IBM6 citations74
US6960514B2Nov 1, 2005
Pitcher-shaped active area for field effect transistor and method of forming same
IBM9 citations73
US6905976B2Jun 14, 2005
Structure and method of forming a notched gate field effect transistor
IBM9 citations73
US6348394B1Feb 19, 2002
Method and device for array threshold voltage control by trapped charge in trench isolation
IBM7 citations73
US6987042B2Jan 17, 2006
Method of forming a collar using selective SiGe/Amorphous Si Etch
IBM7 citations71
US7696539B2Apr 13, 2010
Device fabrication by anisotropic wet etch
IBM3 citations63
US7666741B2Feb 23, 2010
Corner clipping for field effect devices
IBM5 citations63
US6967384B2Nov 22, 2005
Structure and method for ultra-small grain size polysilicon
IBM5 citations63
US6946345B2Sep 20, 2005
Self-aligned buried strap process using doped HDP oxide
IBM5 citations63
INFINEON TECHNOLOGIES CORP
8 patentsUS6177698B1Jan 23, 2001
Formation of controlled trench top isolation layers for vertical transistors
INFINEON TECHNOLOGIES CORP144 citations98
US6602745B2Aug 5, 2003
Field effect transistor and method of fabrication
INFINEON TECHNOLOGIES CORP23 citations92
US6204140B1Mar 20, 2001
Dynamic random access memory
INFINEON TECHNOLOGIES CORP33 citations92
US6184091B1Feb 6, 2001
Formation of controlled trench top isolation layers for vertical transistors
INFINEON TECHNOLOGIES CORP32 citations92
US6770526B2Aug 3, 2004
Silicon nitride island formation for increased capacitance
INFINEON TECHNOLOGIES CORP16 citations84
US6143599ANov 7, 2000
Method for manufacturing memory cell with trench capacitor
INFINEON TECHNOLOGIES CORP18 citations84
US6297530B1Oct 2, 2001
Self aligned channel implantation
INFINEON TECHNOLOGIES CORP8 citations74
US6579768B2Jun 17, 2003
Field effect transistor and method of fabrication
INFINEON TECHNOLOGIES CORP9 citations73
INFINEON TECHNOLOGIES AG
8 patentsUS6967147B1Nov 22, 2005
Nitrogen implantation using a shadow effect to control gate oxide thickness in DRAM semiconductor
INFINEON TECHNOLOGIES AG37 citations93
US6677205B2Jan 13, 2004
Integrated spacer for gate/source/drain isolation in a vertical array structure
INFINEON TECHNOLOGIES AG22 citations93
US6933206B2Aug 23, 2005
Trench isolation employing a high aspect ratio trench
INFINEON TECHNOLOGIES AG12 citations84
US6853025B2Feb 8, 2005
Trench capacitor with buried strap
INFINEON TECHNOLOGIES AG9 citations74
US6429092B1Aug 6, 2002
Collar formation by selective oxide deposition
INFINEON TECHNOLOGIES AG7 citations73
US6352893B1Mar 5, 2002
Low temperature self-aligned collar formation
INFINEON TECHNOLOGIES AG13 citations73
US6548344B1Apr 15, 2003
Spacer formation process using oxide shield
INFINEON TECHNOLOGIES AG10 citations72
US6893911B2May 17, 2005
Process integration for integrated circuits
INFINEON TECHNOLOGIES AG3 citations63
SIEMENS AG
5 patentsUS6265742B1Jul 24, 2001
Memory cell structure and fabrication
SIEMENS AG51 citations96
US6013937AJan 11, 2000
Buffer layer for improving control of layer thickness
SIEMENS AG32 citations93
US6323103B1Nov 27, 2001
Method for fabricating transistors
SIEMENS AG39 citations92
US6093614AJul 25, 2000
Memory cell structure and fabrication
SIEMENS AG38 citations92
US6074903AJun 13, 2000
Method for forming electrical isolation for semiconductor devices
SIEMENS AG19 citations84
BOSCH GMBH ROBERT
1 patentQIMONDA AG
1 patentShowing the top 50 of 63 patents by PatentIndex Score.