Inventor
BAYRAKTAROGLU ISMET
US5 patents
Patents
5 patentsUS7096393B2Aug 22, 2006
Built-in self-test (BIST) of memory interconnect
SUN MICROSYSTEMS INC25 citations90
US7062694B2Jun 13, 2006
Concurrently programmable dynamic memory built-in self-test (BIST)
SUN MICROSYSTEMS INC15 citations81
US6925617B2Aug 2, 2005
Method and apparatus for generating test pattern for integrated circuit design
SUN MICROSYSTEMS INC13 citations81
US7065724B2Jun 20, 2006
Method and apparatus for generating and verifying libraries for ATPG tool
SUN MICROSYSTEMS INC8 citations71
US7020820B2Mar 28, 2006
Instruction-based built-in self-test (BIST) of external memory
SUN MICROSYSTEMS INC6 citations60