P

Inventor

PATTON EVAN E

US31 patents
⚠️ This page may combine multiple inventors who share the name “PATTON EVAN E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NOVELLUS SYSTEMS INC

28 patents
US6527920B1Mar 4, 2003

Copper electroplating apparatus

NOVELLUS SYSTEMS INC251 citations99
US6964792B1Nov 15, 2005

Methods and apparatus for controlling electrolyte flow for uniform plating

NOVELLUS SYSTEMS INC121 citations98
US6890416B1May 10, 2005

Copper electroplating method and apparatus

NOVELLUS SYSTEMS INC92 citations98
US6551487B1Apr 22, 2003

Methods and apparatus for controlled-angle wafer immersion

NOVELLUS SYSTEMS INC145 citations98
US6162344ADec 19, 2000

Method of electroplating semiconductor wafer using variable currents and mass transfer to obtain uniform plated layer

NOVELLUS SYSTEMS INC179 citations98
US6156167ADec 5, 2000

Clamshell apparatus for electrochemically treating semiconductor wafers

NOVELLUS SYSTEMS INC325 citations98
US6139712AOct 31, 2000

Method of depositing metal layer

NOVELLUS SYSTEMS INC198 citations98
US6110346AAug 29, 2000

Method of electroplating semicoductor wafer using variable currents and mass transfer to obtain uniform plated layer

NOVELLUS SYSTEMS INC158 citations98
US6099702AAug 8, 2000

Electroplating chamber with rotatable wafer holder and pre-wetting and rinsing capability

NOVELLUS SYSTEMS INC203 citations98
US6074544AJun 13, 2000

Method of electroplating semiconductor wafer using variable currents and mass transfer to obtain uniform plated layer

NOVELLUS SYSTEMS INC288 citations98
US6800187B1Oct 5, 2004

Clamshell apparatus for electrochemically treating wafers

NOVELLUS SYSTEMS INC168 citations97
US6773571B1Aug 10, 2004

Method and apparatus for uniform electroplating of thin metal seeded wafers using multiple segmented virtual anode sources

NOVELLUS SYSTEMS INC144 citations97
US6755946B1Jun 29, 2004

Clamshell apparatus with dynamic uniformity control

NOVELLUS SYSTEMS INC79 citations97
US6214193B1Apr 10, 2001

Electroplating process including pre-wetting and rinsing

NOVELLUS SYSTEMS INC48 citations96
US6946065B1Sep 20, 2005

Process for electroplating metal into microscopic recessed features

NOVELLUS SYSTEMS INC60 citations95
US6589401B1Jul 8, 2003

Apparatus for electroplating copper onto semiconductor wafer

NOVELLUS SYSTEMS INC67 citations95
US6436249B1Aug 20, 2002

Clamshell apparatus for electrochemically treating semiconductor wafers

NOVELLUS SYSTEMS INC69 citations95
US7189647B2Mar 13, 2007

Sequential station tool for wet processing of semiconductor wafers

NOVELLUS SYSTEMS INC41 citations94
US7686927B1Mar 30, 2010

Methods and apparatus for controlled-angle wafer positioning

NOVELLUS SYSTEMS INC26 citations92
US7097410B1Aug 29, 2006

Methods and apparatus for controlled-angle wafer positioning

NOVELLUS SYSTEMS INC28 citations92
US7033465B1Apr 25, 2006

Clamshell apparatus with crystal shielding and in-situ rinse-dry

NOVELLUS SYSTEMS INC48 citations92
US6716334B1Apr 6, 2004

Electroplating process chamber and method with pre-wetting and rinsing capability

NOVELLUS SYSTEMS INC30 citations92
US6343793B1Feb 5, 2002

Dual channel rotary union

NOVELLUS SYSTEMS INC19 citations92
US8048280B2Nov 1, 2011

Process for electroplating metals into microscopic recessed features

NOVELLUS SYSTEMS INC24 citations91
US7084466B1Aug 1, 2006

Liquid detection end effector sensor and method of using the same

NOVELLUS SYSTEMS INC14 citations84
US7696538B2Apr 13, 2010

Sensor for measuring liquid contaminants in a semiconductor wafer fabrication process

NOVELLUS SYSTEMS INC3 citations63
US8883640B1Nov 11, 2014

Sequential station tool for wet processing of semiconductor wafers

NOVELLUS SYSTEMS INC3 citations60
US8026174B1Sep 27, 2011

Sequential station tool for wet processing of semiconductor wafers

NOVELLUS SYSTEMS INC3 citations60

TEKTRONIX INC

2 patents

PATTON EVAN E

1 patent