Inventor
NORRIS ALAN D
US9 patents
Patents
9 patentsUS6330697B1Dec 11, 2001
Apparatus and method for performing a defect leakage screen test for memory devices
IBM36 citations88
US6708298B2Mar 16, 2004
Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices
IBM13 citations81
US6658604B1Dec 2, 2003
Method for testing and guaranteeing that skew between two signals meets predetermined criteria
IBM16 citations81
US7194670B2Mar 20, 2007
Command multiplier for built-in-self-test
IBM9 citations73
US7221601B2May 22, 2007
Timer lockout circuit for synchronous applications
IBM5 citations60
US7068564B2Jun 27, 2006
Timer lockout circuit for synchronous applications
IBM2 citations60
US7243276B2Jul 10, 2007
Method for performing a burn-in test
IBM2 citations56
US8008142B2Aug 30, 2011
Self-aligned Schottky diode
IBM0 citations52
US7463548B2Dec 9, 2008
Method for performing a burn-in test
IBM1 citations45