Inventor

SAMSAVAR AMIN

US17 patents

⚠️ This page may combine multiple inventors who share the name “SAMSAVAR AMIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSAVAR AMIN

KLA TENCOR CORP

Dual stage instrument for scanning a specimen

Dual stage instrument for scanning a specimen

Optical profilometer combined with stylus probe measurement device

Acoustic sensor as proximity detector

System for locating a feature of a surface

Dual stage instrument for scanning a specimen

System for sensing a sample

System for sensing a sample

System for sensing a sample

KLA TENCOR TECH CORP

Methods and systems for determining a property of an insulating film

Contactless charge measurement of product wafers and control of corona generation and deposition

Tank probe for measuring surface conductance

Method and system for detecting metal contamination on a semiconductor wafer

Methods and systems for determining a property of an insulating film

Systems configured to perform a non-contact method for determining a property of a specimen

Contactless charge measurement of product wafers and control of corona generation and deposition

STRAW MARCUS

Method for laser machining a sample having a crystalline structure