Inventor

HASEGAWA TOMOKAZU

JP4 patents

⚠️ This page may combine multiple inventors who share the name “HASEGAWA TOMOKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HASEGAWA TOMOKAZU

2 patents

US9008270B2Apr 14, 2015

Sample cooling apparatus for X-ray diffractometer and X-ray diffractometer

HASEGAWA TOMOKAZU2 citations46

US8876972B2Nov 4, 2014

Crystallization device

HASEGAWA TOMOKAZU0 citations30

NEC ELECTRONICS CORP

1 patent

US7061256B2Jun 13, 2006

Method and apparatus for contact resistance measurement

NEC ELECTRONICS CORP22 citations86

HINODE INC

1 patent

US7648307B2Jan 19, 2010

Underground structure cover

HINODE INC2 citations51