Inventor · disambiguated record
Ki-Hwan Park
Also filed as: PARK KI H · PARK KI-HWAN
6 granted patents·6 pending applications·127 citations·filing 1993–2014
82Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6TRINUS SYSTEMS INC2POSTECH ACADEMY-INDUSTRY FOUND1REPUBLIC OF KOREA MINISTRY OF FOOD AND DRUG SAFETY1
Top patents by PatentIndex Score
12 records- 0179US5553726ADripless feeder nipple system with detachable valveFiled 1993·Granted Sep 10, 1996·99 cites·11 claims
- 0277US7398676B2Leak sensor and leak sensing systemSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 15, 2008·11 cites·22 claims
- 0354US7018093B2Apparatus and method for sensing defects in temperature sensorsSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 28, 2006·8 cites·10 claims
- 0449US7931035B2Method of and apparatus for cleaning semiconductor wafersSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Apr 26, 2011·4 cites·10 claims
- 0548US7186299B2Method of rinsing and drying semiconductor substratesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 6, 2007·5 cites·13 claims
- 0645US2017347025A1User-wearable type photographing deviceTRINUS SYSTEMS INC·Filed 2014·Application pending·0 cites
- 0744US2017339366A1Wireless microphone systemTRINUS SYSTEMS INC·Filed 2014·Application pending·0 cites
- 0843US9719989B2Method for detecting food poisoning bacteria using magnetic nanoparticles and solution having high viscosityPOSTECH ACADEMY-INDUSTRY FOUND·Filed 2013·Granted Aug 1, 2017·0 cites·13 claims
- 0941US2014093982A1Measurement method and measurement kit of antibiotics concentrationREPUBLIC OF KOREA MINISTRY OF FOOD AND DRUG SAFETY·Filed 2013·Application pending·0 cites
- 1041US2011168211A1Semiconductor wafer cleaning system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2011·Application pending·0 cites
- 1136US2007119486A1System for rinsing and drying semiconductor substratesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1230US2004222191A1Method and apparatus for wet etching using hot etchantFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →