Inventor
FUKAZAWA ATSUKI
JP80 patents
⚠️ This page may combine multiple inventors who share the name “FUKAZAWA ATSUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ASM IP HOLDING BV
22 patentsUS10468251B2Nov 5, 2019
Method for forming spacers using silicon nitride film for spacer-defined multiple patterning
ASM IP HOLDING BV379 citations99
US10395917B2Aug 27, 2019
Si precursors for deposition of SiN at low temperatures
ASM IP HOLDING BV405 citations99
US10186420B2Jan 22, 2019
Formation of silicon-containing thin films
ASM IP HOLDING BV472 citations99
US10179947B2Jan 15, 2019
Method for forming conformal nitrided, oxidized, or carbonized dielectric film by atomic layer deposition
ASM IP HOLDING BV413 citations99
US9812319B1Nov 7, 2017
Method for forming film filled in trench without seam or void
ASM IP HOLDING BV486 citations99
US9754779B1Sep 5, 2017
Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches
ASM IP HOLDING BV484 citations99
US9627221B1Apr 18, 2017
Continuous process incorporating atomic layer etching
ASM IP HOLDING BV507 citations99
US9455138B1Sep 27, 2016
Method for forming dielectric film in trenches by PEALD using H-containing gas
ASM IP HOLDING BV587 citations99
US9396956B1Jul 19, 2016
Method of plasma-enhanced atomic layer etching
ASM IP HOLDING BV518 citations99
US9343297B1May 17, 2016
Method for forming multi-element thin film constituted by at least five elements by PEALD
ASM IP HOLDING BV471 citations99
US8912101B2Dec 16, 2014
Method for forming Si-containing film using two precursors by ALD
ASM IP HOLDING BV522 citations99
US10435790B2Oct 8, 2019
Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap
ASM IP HOLDING BV397 citations98
US9023737B2May 5, 2015
Method for forming conformal, homogeneous dielectric film by cyclic deposition and heat treatment
ASM IP HOLDING BV544 citations98
US10529554B2Jan 7, 2020
Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches
ASM IP HOLDING BV377 citations97
US9142393B2Sep 22, 2015
Method for cleaning reaction chamber using pre-cleaning process
ASM IP HOLDING BV521 citations97
US10395919B2Aug 27, 2019
Method and apparatus for filling a gap
ASM IP HOLDING BV402 citations95
US8784951B2Jul 22, 2014
Method for forming insulation film using non-halide precursor having four or more silicons
ASM IP HOLDING BV518 citations95
US9905416B2Feb 27, 2018
Si precursors for deposition of SiN at low temperatures
ASM IP HOLDING BV19 citations94
US9564309B2Feb 7, 2017
Si precursors for deposition of SiN at low temperatures
ASM IP HOLDING BV29 citations94
US10755922B2Aug 25, 2020
Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition
ASM IP HOLDING BV8 citations83
US9818601B1Nov 14, 2017
Substrate processing apparatus and method of processing substrate
ASM IP HOLDING BV12 citations82
US11069522B2Jul 20, 2021
Si precursors for deposition of SiN at low temperatures
ASM IP HOLDING BV3 citations73
ASM JAPAN
14 patentsUS8003174B2Aug 23, 2011
Method for forming dielectric film using siloxane-silazane mixture
ASM JAPAN521 citations99
US7919416B2Apr 5, 2011
Method of forming conformal dielectric film having Si-N bonds by PECVD
ASM JAPAN598 citations99
US7842622B1Nov 30, 2010
Method of forming highly conformal amorphous carbon layer
ASM JAPAN524 citations99
US7781352B2Aug 24, 2010
Method for forming inorganic silazane-based dielectric film
ASM JAPAN480 citations99
US7651959B2Jan 26, 2010
Method for forming silazane-based dielectric film
ASM JAPAN589 citations99
US7622369B1Nov 24, 2009
Device isolation technology on semiconductor substrate
ASM JAPAN604 citations99
US7825040B1Nov 2, 2010
Method for depositing flowable material using alkoxysilane or aminosilane precursor
ASM JAPAN545 citations98
US7582575B2Sep 1, 2009
Method for forming insulation film
ASM JAPAN467 citations98
US7354873B2Apr 8, 2008
Method for forming insulation film
ASM JAPAN479 citations98
US7064088B2Jun 20, 2006
Method for forming low-k hard film
ASM JAPAN62 citations96
US6881683B2Apr 19, 2005
Insulation film on semiconductor substrate and method for forming same
ASM JAPAN51 citations92
US6818570B2Nov 16, 2004
Method of forming silicon-containing insulation film having low dielectric constant and high mechanical strength
ASM JAPAN35 citations92
US6852650B2Feb 8, 2005
Insulation film on semiconductor substrate and method for forming same
ASM JAPAN19 citations84
US6211077B1Apr 3, 2001
Method for forming polycrystal silicon film for semiconductor elements
ASM JAPAN14 citations74
ASM INT NV
5 patentsUS10147600B2Dec 4, 2018
Methods for forming doped silicon oxide thin films
ASM INT NV417 citations99
US9875893B2Jan 23, 2018
Methods for forming doped silicon oxide thin films
ASM INT NV419 citations99
US9564314B2Feb 7, 2017
Methods for forming doped silicon oxide thin films
ASM INT NV465 citations99
US10510530B2Dec 17, 2019
Methods for forming doped silicon oxide thin films
ASM INT NV3 citations84
US11302527B2Apr 12, 2022
Methods for forming doped silicon oxide thin films
ASM INT NV1 citations73
FUKAZAWA ATSUKI
4 patentsUS8784950B2Jul 22, 2014
Method for forming aluminum oxide film using Al compound containing alkyl group and alkoxy or alkylamine group
FUKAZAWA ATSUKI519 citations99
US8722546B2May 13, 2014
Method for forming silicon-containing dielectric film by cyclic deposition with side wall coverage control
FUKAZAWA ATSUKI554 citations99
US8563443B2Oct 22, 2013
Method of depositing dielectric film by ALD using precursor containing silicon, hydrocarbon, and halogen
FUKAZAWA ATSUKI525 citations99
US8329599B2Dec 11, 2012
Method of depositing dielectric film by ALD using precursor containing silicon, hydrocarbon, and halogen
FUKAZAWA ATSUKI575 citations98
ASM INT
3 patentsKOBAYASHI AKIKO
1 patentHSIEH JULIAN J
1 patentShowing the top 50 of 80 patents by PatentIndex Score.