P

Inventor

FUKAZAWA ATSUKI

JP80 patents
⚠️ This page may combine multiple inventors who share the name “FUKAZAWA ATSUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASM IP HOLDING BV

22 patents
US10468251B2Nov 5, 2019

Method for forming spacers using silicon nitride film for spacer-defined multiple patterning

ASM IP HOLDING BV379 citations99
US10395917B2Aug 27, 2019

Si precursors for deposition of SiN at low temperatures

ASM IP HOLDING BV405 citations99
US10186420B2Jan 22, 2019

Formation of silicon-containing thin films

ASM IP HOLDING BV472 citations99
US10179947B2Jan 15, 2019

Method for forming conformal nitrided, oxidized, or carbonized dielectric film by atomic layer deposition

ASM IP HOLDING BV413 citations99
US9812319B1Nov 7, 2017

Method for forming film filled in trench without seam or void

ASM IP HOLDING BV486 citations99
US9754779B1Sep 5, 2017

Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches

ASM IP HOLDING BV484 citations99
US9627221B1Apr 18, 2017

Continuous process incorporating atomic layer etching

ASM IP HOLDING BV507 citations99
US9455138B1Sep 27, 2016

Method for forming dielectric film in trenches by PEALD using H-containing gas

ASM IP HOLDING BV587 citations99
US9396956B1Jul 19, 2016

Method of plasma-enhanced atomic layer etching

ASM IP HOLDING BV518 citations99
US9343297B1May 17, 2016

Method for forming multi-element thin film constituted by at least five elements by PEALD

ASM IP HOLDING BV471 citations99
US8912101B2Dec 16, 2014

Method for forming Si-containing film using two precursors by ALD

ASM IP HOLDING BV522 citations99
US10435790B2Oct 8, 2019

Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap

ASM IP HOLDING BV397 citations98
US9023737B2May 5, 2015

Method for forming conformal, homogeneous dielectric film by cyclic deposition and heat treatment

ASM IP HOLDING BV544 citations98
US10529554B2Jan 7, 2020

Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches

ASM IP HOLDING BV377 citations97
US9142393B2Sep 22, 2015

Method for cleaning reaction chamber using pre-cleaning process

ASM IP HOLDING BV521 citations97
US10395919B2Aug 27, 2019

Method and apparatus for filling a gap

ASM IP HOLDING BV402 citations95
US8784951B2Jul 22, 2014

Method for forming insulation film using non-halide precursor having four or more silicons

ASM IP HOLDING BV518 citations95
US9905416B2Feb 27, 2018

Si precursors for deposition of SiN at low temperatures

ASM IP HOLDING BV19 citations94
US9564309B2Feb 7, 2017

Si precursors for deposition of SiN at low temperatures

ASM IP HOLDING BV29 citations94
US10755922B2Aug 25, 2020

Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition

ASM IP HOLDING BV8 citations83
US9818601B1Nov 14, 2017

Substrate processing apparatus and method of processing substrate

ASM IP HOLDING BV12 citations82
US11069522B2Jul 20, 2021

Si precursors for deposition of SiN at low temperatures

ASM IP HOLDING BV3 citations73

ASM JAPAN

14 patents
US8003174B2Aug 23, 2011

Method for forming dielectric film using siloxane-silazane mixture

ASM JAPAN521 citations99
US7919416B2Apr 5, 2011

Method of forming conformal dielectric film having Si-N bonds by PECVD

ASM JAPAN598 citations99
US7842622B1Nov 30, 2010

Method of forming highly conformal amorphous carbon layer

ASM JAPAN524 citations99
US7781352B2Aug 24, 2010

Method for forming inorganic silazane-based dielectric film

ASM JAPAN480 citations99
US7651959B2Jan 26, 2010

Method for forming silazane-based dielectric film

ASM JAPAN589 citations99
US7622369B1Nov 24, 2009

Device isolation technology on semiconductor substrate

ASM JAPAN604 citations99
US7825040B1Nov 2, 2010

Method for depositing flowable material using alkoxysilane or aminosilane precursor

ASM JAPAN545 citations98
US7582575B2Sep 1, 2009

Method for forming insulation film

ASM JAPAN467 citations98
US7354873B2Apr 8, 2008

Method for forming insulation film

ASM JAPAN479 citations98
US7064088B2Jun 20, 2006

Method for forming low-k hard film

ASM JAPAN62 citations96
US6881683B2Apr 19, 2005

Insulation film on semiconductor substrate and method for forming same

ASM JAPAN51 citations92
US6818570B2Nov 16, 2004

Method of forming silicon-containing insulation film having low dielectric constant and high mechanical strength

ASM JAPAN35 citations92
US6852650B2Feb 8, 2005

Insulation film on semiconductor substrate and method for forming same

ASM JAPAN19 citations84
US6211077B1Apr 3, 2001

Method for forming polycrystal silicon film for semiconductor elements

ASM JAPAN14 citations74

ASM INT NV

5 patents

FUKAZAWA ATSUKI

4 patents

ASM INT

3 patents

KOBAYASHI AKIKO

1 patent

HSIEH JULIAN J

1 patent

Showing the top 50 of 80 patents by PatentIndex Score.