Inventor
RHEE HWA-SUNG
KR71 patents
⚠️ This page may combine multiple inventors who share the name “RHEE HWA-SUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
47 patentsUS7952147B2May 31, 2011
Semiconductor device having analog transistor with improved operating and flicker noise characteristics and method of making same
SAMSUNG ELECTRONICS CO LTD122 citations99
US7642140B2Jan 5, 2010
CMOS integrated circuit devices and substrates having buried silicon germanium layers therein and method of forming same
SAMSUNG ELECTRONICS CO LTD135 citations99
US6633066B1Oct 14, 2003
CMOS integrated circuit devices and substrates having unstrained silicon active layers
SAMSUNG ELECTRONICS CO LTD124 citations99
US7361563B2Apr 22, 2008
Methods of fabricating a semiconductor device using a selective epitaxial growth technique
SAMSUNG ELECTRONICS CO LTD94 citations98
US7183172B2Feb 27, 2007
Method of forming silicon-on-insulator (SOI) semiconductor substrate and SOI semiconductor substrate formed thereby
SAMSUNG ELECTRONICS CO LTD95 citations98
US7385247B2Jun 10, 2008
At least penta-sided-channel type of FinFET transistor
SAMSUNG ELECTRONICS CO LTD46 citations96
US6670677B2Dec 30, 2003
SOI substrate having an etch stop layer and an SOI integrated circuit fabricated thereon
SAMSUNG ELECTRONICS CO LTD45 citations96
US6881621B2Apr 19, 2005
Method of fabricating SOI substrate having an etch stop layer, and method of fabricating SOI integrated circuit using the same
SAMSUNG ELECTRONICS CO LTD19 citations93
US6815320B2Nov 9, 2004
Method for fabricating semiconductor device including gate spacer
SAMSUNG ELECTRONICS CO LTD24 citations93
US6806517B2Oct 19, 2004
Flash memory having local SONOS structure using notched gate and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD47 citations93
US6794306B2Sep 21, 2004
Semiconductor device having gate all around type transistor and method of forming the same
SAMSUNG ELECTRONICS CO LTD16 citations93
US6716689B2Apr 6, 2004
MOS transistor having a T-shaped gate electrode and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD20 citations93
US6605847B2Aug 12, 2003
Semiconductor device having gate all around type transistor and method of forming the same
SAMSUNG ELECTRONICS CO LTD32 citations93
US6524902B2Feb 25, 2003
Method of manufacturing CMOS semiconductor device
SAMSUNG ELECTRONICS CO LTD26 citations93
US7671420B2Mar 2, 2010
Semiconductor devices having faceted channels and methods of fabricating such devices
SAMSUNG ELECTRONICS CO LTD28 citations92
US7354835B2Apr 8, 2008
Method of fabricating CMOS transistor and CMOS transistor fabricated thereby
SAMSUNG ELECTRONICS CO LTD26 citations92
US7250655B2Jul 31, 2007
MOS transistor having a T-shaped gate electrode
SAMSUNG ELECTRONICS CO LTD38 citations92
US7195987B2Mar 27, 2007
Methods of forming CMOS integrated circuit devices and substrates having buried silicon germanium layers therein
SAMSUNG ELECTRONICS CO LTD26 citations92
US7033895B2Apr 25, 2006
Method of fabricating a MOS transistor with elevated source/drain structure using a selective epitaxial growth process
SAMSUNG ELECTRONICS CO LTD22 citations92
US6914301B2Jul 5, 2005
CMOS integrated circuit devices and substrates having buried silicon germanium layers therein and methods of forming same
SAMSUNG ELECTRONICS CO LTD20 citations92
US6881650B2Apr 19, 2005
Method for forming SOI substrate
SAMSUNG ELECTRONICS CO LTD29 citations92
US6696328B2Feb 24, 2004
CMOS gate electrode using selective growth and a fabrication method thereof
SAMSUNG ELECTRONICS CO LTD24 citations92
US6693013B2Feb 17, 2004
Semiconductor transistor using L-shaped spacer and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD29 citations92
US6518645B2Feb 11, 2003
SOI-type semiconductor device and method of forming the same
SAMSUNG ELECTRONICS CO LTD44 citations92
US6667525B2Dec 23, 2003
Semiconductor device having hetero grain stack gate
SAMSUNG ELECTRONICS CO LTD24 citations91
US9984886B2May 29, 2018
Semiconductor devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD10 citations84
US7723193B2May 25, 2010
Method of forming an at least penta-sided-channel type of FinFET transistor
SAMSUNG ELECTRONICS CO LTD13 citations84
US7611951B2Nov 3, 2009
Method of fabricating MOS transistor having epitaxial region
SAMSUNG ELECTRONICS CO LTD9 citations84
US7601983B2Oct 13, 2009
Transistor and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD13 citations84
US7576395B2Aug 18, 2009
Dual gate stack CMOS structure with different dielectrics
SAMSUNG ELECTRONICS CO LTD11 citations84
US10032886B2Jul 24, 2018
Semiconductor device
SAMSUNG ELECTRONICS CO LTD8 citations82
US9318573B2Apr 19, 2016
Field effect transistor having germanium nanorod and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD15 citations82
US7611973B2Nov 3, 2009
Methods of selectively forming epitaxial semiconductor layer on single crystalline semiconductor and semiconductor devices fabricated using the same
SAMSUNG ELECTRONICS CO LTD7 citations74
US6917085B2Jul 12, 2005
Semiconductor transistor using L-shaped spacer
SAMSUNG ELECTRONICS CO LTD7 citations74
US6750532B2Jun 15, 2004
CMOS semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD9 citations74
US10074572B2Sep 11, 2018
Integrated circuit devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US9412693B2Aug 9, 2016
Semiconductor device having jumper pattern and blocking pattern
SAMSUNG ELECTRONICS CO LTD4 citations72
US6884705B2Apr 26, 2005
Semiconductor device having hetero grain stack gate and method of forming the same
SAMSUNG ELECTRONICS CO LTD6 citations72
US11183496B2Nov 23, 2021
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations63
US7879668B2Feb 1, 2011
Method of manufacturing a semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations63
US7791146B2Sep 7, 2010
Semiconductor device including field effect transistor and method of forming the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7776723B2Aug 17, 2010
Method of manufacturing an epitaxial semiconductor substrate and method of manufacturing a semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations63
US7728393B2Jun 1, 2010
Semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations63
US7714394B2May 11, 2010
CMOS semiconductor devices having elevated source and drain regions and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD6 citations63
US7619285B2Nov 17, 2009
Method of fabricating CMOS transistor and CMOS transistor fabricated thereby
SAMSUNG ELECTRONICS CO LTD4 citations63
US7582535B2Sep 1, 2009
Method of forming MOS transistor having fully silicided metal gate electrode
SAMSUNG ELECTRONICS CO LTD3 citations63
US7439596B2Oct 21, 2008
Transistors for semiconductor device and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD5 citations63
KIM MYUNG-SUN
1 patentCHUNG JAE-YUP
1 patentCHUNG JAE YUP
1 patentShowing the top 50 of 71 patents by PatentIndex Score.