P

Inventor

RHEE HWA-SUNG

KR71 patents
⚠️ This page may combine multiple inventors who share the name “RHEE HWA-SUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

47 patents
US7952147B2May 31, 2011

Semiconductor device having analog transistor with improved operating and flicker noise characteristics and method of making same

SAMSUNG ELECTRONICS CO LTD122 citations99
US7642140B2Jan 5, 2010

CMOS integrated circuit devices and substrates having buried silicon germanium layers therein and method of forming same

SAMSUNG ELECTRONICS CO LTD135 citations99
US6633066B1Oct 14, 2003

CMOS integrated circuit devices and substrates having unstrained silicon active layers

SAMSUNG ELECTRONICS CO LTD124 citations99
US7361563B2Apr 22, 2008

Methods of fabricating a semiconductor device using a selective epitaxial growth technique

SAMSUNG ELECTRONICS CO LTD94 citations98
US7183172B2Feb 27, 2007

Method of forming silicon-on-insulator (SOI) semiconductor substrate and SOI semiconductor substrate formed thereby

SAMSUNG ELECTRONICS CO LTD95 citations98
US7385247B2Jun 10, 2008

At least penta-sided-channel type of FinFET transistor

SAMSUNG ELECTRONICS CO LTD46 citations96
US6670677B2Dec 30, 2003

SOI substrate having an etch stop layer and an SOI integrated circuit fabricated thereon

SAMSUNG ELECTRONICS CO LTD45 citations96
US6881621B2Apr 19, 2005

Method of fabricating SOI substrate having an etch stop layer, and method of fabricating SOI integrated circuit using the same

SAMSUNG ELECTRONICS CO LTD19 citations93
US6815320B2Nov 9, 2004

Method for fabricating semiconductor device including gate spacer

SAMSUNG ELECTRONICS CO LTD24 citations93
US6806517B2Oct 19, 2004

Flash memory having local SONOS structure using notched gate and manufacturing method thereof

SAMSUNG ELECTRONICS CO LTD47 citations93
US6794306B2Sep 21, 2004

Semiconductor device having gate all around type transistor and method of forming the same

SAMSUNG ELECTRONICS CO LTD16 citations93
US6716689B2Apr 6, 2004

MOS transistor having a T-shaped gate electrode and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD20 citations93
US6605847B2Aug 12, 2003

Semiconductor device having gate all around type transistor and method of forming the same

SAMSUNG ELECTRONICS CO LTD32 citations93
US6524902B2Feb 25, 2003

Method of manufacturing CMOS semiconductor device

SAMSUNG ELECTRONICS CO LTD26 citations93
US7671420B2Mar 2, 2010

Semiconductor devices having faceted channels and methods of fabricating such devices

SAMSUNG ELECTRONICS CO LTD28 citations92
US7354835B2Apr 8, 2008

Method of fabricating CMOS transistor and CMOS transistor fabricated thereby

SAMSUNG ELECTRONICS CO LTD26 citations92
US7250655B2Jul 31, 2007

MOS transistor having a T-shaped gate electrode

SAMSUNG ELECTRONICS CO LTD38 citations92
US7195987B2Mar 27, 2007

Methods of forming CMOS integrated circuit devices and substrates having buried silicon germanium layers therein

SAMSUNG ELECTRONICS CO LTD26 citations92
US7033895B2Apr 25, 2006

Method of fabricating a MOS transistor with elevated source/drain structure using a selective epitaxial growth process

SAMSUNG ELECTRONICS CO LTD22 citations92
US6914301B2Jul 5, 2005

CMOS integrated circuit devices and substrates having buried silicon germanium layers therein and methods of forming same

SAMSUNG ELECTRONICS CO LTD20 citations92
US6881650B2Apr 19, 2005

Method for forming SOI substrate

SAMSUNG ELECTRONICS CO LTD29 citations92
US6696328B2Feb 24, 2004

CMOS gate electrode using selective growth and a fabrication method thereof

SAMSUNG ELECTRONICS CO LTD24 citations92
US6693013B2Feb 17, 2004

Semiconductor transistor using L-shaped spacer and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD29 citations92
US6518645B2Feb 11, 2003

SOI-type semiconductor device and method of forming the same

SAMSUNG ELECTRONICS CO LTD44 citations92
US6667525B2Dec 23, 2003

Semiconductor device having hetero grain stack gate

SAMSUNG ELECTRONICS CO LTD24 citations91
US9984886B2May 29, 2018

Semiconductor devices and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD10 citations84
US7723193B2May 25, 2010

Method of forming an at least penta-sided-channel type of FinFET transistor

SAMSUNG ELECTRONICS CO LTD13 citations84
US7611951B2Nov 3, 2009

Method of fabricating MOS transistor having epitaxial region

SAMSUNG ELECTRONICS CO LTD9 citations84
US7601983B2Oct 13, 2009

Transistor and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD13 citations84
US7576395B2Aug 18, 2009

Dual gate stack CMOS structure with different dielectrics

SAMSUNG ELECTRONICS CO LTD11 citations84
US10032886B2Jul 24, 2018

Semiconductor device

SAMSUNG ELECTRONICS CO LTD8 citations82
US9318573B2Apr 19, 2016

Field effect transistor having germanium nanorod and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD15 citations82
US7611973B2Nov 3, 2009

Methods of selectively forming epitaxial semiconductor layer on single crystalline semiconductor and semiconductor devices fabricated using the same

SAMSUNG ELECTRONICS CO LTD7 citations74
US6917085B2Jul 12, 2005

Semiconductor transistor using L-shaped spacer

SAMSUNG ELECTRONICS CO LTD7 citations74
US6750532B2Jun 15, 2004

CMOS semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD9 citations74
US10074572B2Sep 11, 2018

Integrated circuit devices and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD2 citations72
US9412693B2Aug 9, 2016

Semiconductor device having jumper pattern and blocking pattern

SAMSUNG ELECTRONICS CO LTD4 citations72
US6884705B2Apr 26, 2005

Semiconductor device having hetero grain stack gate and method of forming the same

SAMSUNG ELECTRONICS CO LTD6 citations72
US11183496B2Nov 23, 2021

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations63
US7879668B2Feb 1, 2011

Method of manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations63
US7791146B2Sep 7, 2010

Semiconductor device including field effect transistor and method of forming the same

SAMSUNG ELECTRONICS CO LTD2 citations63
US7776723B2Aug 17, 2010

Method of manufacturing an epitaxial semiconductor substrate and method of manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations63
US7728393B2Jun 1, 2010

Semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations63
US7714394B2May 11, 2010

CMOS semiconductor devices having elevated source and drain regions and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD6 citations63
US7619285B2Nov 17, 2009

Method of fabricating CMOS transistor and CMOS transistor fabricated thereby

SAMSUNG ELECTRONICS CO LTD4 citations63
US7582535B2Sep 1, 2009

Method of forming MOS transistor having fully silicided metal gate electrode

SAMSUNG ELECTRONICS CO LTD3 citations63
US7439596B2Oct 21, 2008

Transistors for semiconductor device and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD5 citations63

KIM MYUNG-SUN

1 patent

CHUNG JAE-YUP

1 patent

CHUNG JAE YUP

1 patent

Showing the top 50 of 71 patents by PatentIndex Score.