Inventor
JO AH JIN
KR3 patents
Patents
3 patentsUS9645169B2May 9, 2017
Measurement apparatus and method with adaptive scan rate
PARK SYSTEMS CORP0 citations36
US10133052B2Nov 20, 2018
Image acquiring method and image acquiring apparatus using the same
PARK SYSTEMS CORP0 citations31
US9081272B2Jul 14, 2015
Leveling apparatus and atomic force microscope including the same
PARK SYSTEMS CORP0 citations24