Inventor
CHEN SHIH-HSIN
TW24 patents
⚠️ This page may combine multiple inventors who share the name “CHEN SHIH-HSIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MEDIATEK INC
9 patentsUS8381018B2Feb 19, 2013
Method for data recovery for flash devices
MEDIATEK INC5 citations71
US7788549B2Aug 31, 2010
Apparatus and method for defect replacement
MEDIATEK INC2 citations62
US7669091B2Feb 23, 2010
Apparatus and method for defect replacement
MEDIATEK INC2 citations62
US7539105B2May 26, 2009
Data managing method for an optical disc drive writing user data into an optical disc having defects
MEDIATEK INC2 citations61
US7738329B2Jun 15, 2010
Random access control method and optical disc drive
MEDIATEK INC3 citations60
US7948842B2May 24, 2011
Random access control method and optical disc driver
MEDIATEK INC2 citations59
US7661021B2Feb 9, 2010
Method for defect management in rewritable optical storage media
MEDIATEK INC2 citations59
US8009528B2Aug 30, 2011
Method for recovering management information of a recording medium and apparatus therefor
MEDIATEK INC0 citations51
US7821895B2Oct 26, 2010
Data managing method for an optical disc drive writing user data into an optical disc having defects
MEDIATEK INC1 citations51
TAIWAN SEMICONDUCTOR MFG
3 patentsUS8943455B2Jan 27, 2015
Methods for layout verification for polysilicon cell edge structures in FinFET standard cells
TAIWAN SEMICONDUCTOR MFG38 citations93
US9342647B2May 17, 2016
Integrated circuit design method and apparatus
TAIWAN SEMICONDUCTOR MFG17 citations83
US9053283B2Jun 9, 2015
Methods for layout verification for polysilicon cell edge structures in finFET standard cells using filters
TAIWAN SEMICONDUCTOR MFG6 citations83
TAIWAN SEMICONDUCTOR MFG CO LTD
3 patentsUS9582630B2Feb 28, 2017
System and method for creating hybrid resistance and capacitance (RC) netlist using three-dimensional RC extraction and 2.5 dimensional RC extraction
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9495506B2Nov 15, 2016
Methods for layout verification for polysilicon cell edge structures in FinFET standard cells using filters
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations72
US9977072B2May 22, 2018
Semiconductor structure and method for operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48