Inventor
KANG DONG-KU
KR48 patents
⚠️ This page may combine multiple inventors who share the name “KANG DONG-KU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
36 patentsUS7468907B2Dec 23, 2008
Programming method for flash memory capable of compensating reduction of read margin between states due to hot temperature stress
SAMSUNG ELECTRONICS CO LTD72 citations98
US7876614B2Jan 25, 2011
Multi-bit flash memory device and program and read methods thereof
SAMSUNG ELECTRONICS CO LTD19 citations93
US7545677B2Jun 9, 2009
Nonvolatile memory device and methods of programming and reading the same
SAMSUNG ELECTRONICS CO LTD41 citations93
US7272049B2Sep 18, 2007
Nonvolatile semiconductor memory device having uniform operational characteristics for memory cells
SAMSUNG ELECTRONICS CO LTD48 citations93
US8040725B2Oct 18, 2011
Flash memory device and method for adjusting read voltage of flash memory device
SAMSUNG ELECTRONICS CO LTD38 citations92
US7962831B2Jun 14, 2011
Multi-level cell memory device and method thereof
SAMSUNG ELECTRONICS CO LTD28 citations92
US7561467B2Jul 14, 2009
Flash memory device using program data cache and programming method thereof
SAMSUNG ELECTRONICS CO LTD22 citations92
US9858993B2Jan 2, 2018
Non-volatile memory device and method of programming the same
SAMSUNG ELECTRONICS CO LTD7 citations84
US9058890B2Jun 16, 2015
Over-sampling read operation for a flash memory device
SAMSUNG ELECTRONICS CO LTD6 citations84
US8020081B2Sep 13, 2011
Multi-level cell memory devices using trellis coded modulation and methods of storing data in and reading data from the memory devices
SAMSUNG ELECTRONICS CO LTD12 citations84
US7898853B2Mar 1, 2011
Multi-bit data memory system and read operation
SAMSUNG ELECTRONICS CO LTD7 citations84
US7835209B2Nov 16, 2010
Method and apparatus for controlling reading level of memory cell
SAMSUNG ELECTRONICS CO LTD11 citations84
US7791938B2Sep 7, 2010
MSB-based error correction for flash memory system
SAMSUNG ELECTRONICS CO LTD10 citations84
US7768827B2Aug 3, 2010
Data verification method and semiconductor memory
SAMSUNG ELECTRONICS CO LTD11 citations84
US7701775B2Apr 20, 2010
Flash memory device utilizing multi-page program method
SAMSUNG ELECTRONICS CO LTD17 citations84
US9852795B2Dec 26, 2017
Methods of operating nonvolatile memory devices, and memory systems including nonvolatile memory devices
SAMSUNG ELECTRONICS CO LTD5 citations73
US9418747B2Aug 16, 2016
Nonvolatile memory device maintaining a bitline precharge during program verification periods for multi-level memory cells and related programming method
SAMSUNG ELECTRONICS CO LTD3 citations73
US9478280B2Oct 25, 2016
Programmed data verification for a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD3 citations70
US8050115B2Nov 1, 2011
Non-volatile memory device and method of operation therefor
SAMSUNG ELECTRONICS CO LTD4 citations63
US7957186B2Jun 7, 2011
Non-volatile memory system and data read method of non-volatile memory system
SAMSUNG ELECTRONICS CO LTD2 citations63
US7706181B2Apr 27, 2010
Multi-bit programming device and method using single-bit memory cells
SAMSUNG ELECTRONICS CO LTD5 citations63
US7623374B2Nov 24, 2009
Non-volatile memory devices and methods of programming the same
SAMSUNG ELECTRONICS CO LTD4 citations63
US7589998B2Sep 15, 2009
Non-volatile memory device and method of operation therefor
SAMSUNG ELECTRONICS CO LTD3 citations63
US7463526B2Dec 9, 2008
Programming method for flash memory capable of compensating reduction of read margin between states due to high temperature stress
SAMSUNG ELECTRONICS CO LTD2 citations63
US11527473B2Dec 13, 2022
Semiconductor memory device including capacitor
SAMSUNG ELECTRONICS CO LTD1 citations61
US11670377B2Jun 6, 2023
Page buffer and memory device including the same
SAMSUNG ELECTRONICS CO LTD0 citations59
US11114167B2Sep 7, 2021
Page buffer and memory device including the same
SAMSUNG ELECTRONICS CO LTD1 citations59
US10133680B2Nov 20, 2018
Data storage apparatus, coding unit, systems including the same, method of coding and method of reading data
SAMSUNG ELECTRONICS CO LTD0 citations52
US8345484B2Jan 1, 2013
Nonvolatile memory device and system, and method of programming a nonvolatile memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US7864571B2Jan 4, 2011
Memory cell programming method and semiconductor memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US7800954B2Sep 21, 2010
Apparatus for reading data and method using the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US7751239B2Jul 6, 2010
Device for reading memory data and method using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7505313B2Mar 17, 2009
Program method of flash memory capable of compensating reduction of read margin between states due to hot temperature stress
SAMSUNG ELECTRONICS CO LTD1 citations52
US9928006B2Mar 27, 2018
Memory device and a memory system including the same
SAMSUNG ELECTRONICS CO LTD1 citations51
US11563016B2Jan 24, 2023
Semiconductor memory device including capacitor
SAMSUNG ELECTRONICS CO LTD0 citations50
US8028215B2Sep 27, 2011
Error control code apparatuses and methods of using the same
SAMSUNG ELECTRONICS CO LTD0 citations50
KANG DONG-KU
5 patentsUS9691472B2Jun 27, 2017
Non-volatile memory device and method of programming the same
KANG DONG-KU12 citations84
US8477533B2Jul 2, 2013
Over-sampling read operation for a flash memory device
KANG DONG-KU9 citations84
US8149618B2Apr 3, 2012
Over-sampling read operation for a flash memory device
KANG DONG-KU12 citations84
US9373005B2Jun 21, 2016
Data storage apparatus, coding unit, systems including the same, method of coding and method of reading data
KANG DONG-KU2 citations62
US8208298B2Jun 26, 2012
MSB-based error correction for flash memory system
KANG DONG-KU2 citations62