P

Inventor

YASUI TAKAHIRO

JP10 patents
⚠️ This page may combine multiple inventors who share the name “YASUI TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

5 patents
US6711705B1Mar 23, 2004

Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method

ADVANTEST CORP22 citations91
US6594788B1Jul 15, 2003

Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method

ADVANTEST CORP26 citations91
US6425095B1Jul 23, 2002

Memory testing apparatus

ADVANTEST CORP27 citations91
US6907385B2Jun 14, 2005

Memory defect redress analysis treating method, and memory testing apparatus performing the method

ADVANTEST CORP11 citations72
US9267965B2Feb 23, 2016

Flexible test site synchronization

ADVANTEST CORP2 citations57

YASUI TAKAHIRO

3 patents
US8286045B2Oct 9, 2012

Test apparatus and test method

YASUI TAKAHIRO2 citations58
US8074134B2Dec 6, 2011

Pattern generator and memory testing device using the same

YASUI TAKAHIRO0 citations48
US8423840B2Apr 16, 2013

Pattern generator

YASUI TAKAHIRO0 citations37

FURUKAWA ELECTRIC CO LTD

1 patent
US7265457B2Sep 4, 2007

Power control apparatus

FURUKAWA ELECTRIC CO LTD5 citations62

HITACHI LTD

1 patent
US9960983B2May 1, 2018

Monitoring item selection method and device, and storage medium

HITACHI LTD1 citations51