Inventor

CANNON ETHAN H

US29 patents

⚠️ This page may combine multiple inventors who share the name “CANNON ETHAN H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CANNON ETHAN H

IBM

Soft error reduction of CMOS circuits on substrates with hybrid crystal orientation using buried recombination centers

Structure and method for improving storage latch susceptibility to single event upsets

Apparatus and method for hardening latches in SOI CMOS devices

Design structure for alpha particle sensor in SOI technology and structure thereof

On-chip heater and methods for fabrication thereof and use thereof

Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors

Heater for annealing trapped charge in a semiconductor device

Method for semiconductor device having radiation hardened insulators and design structure thereof

Method for fabricating semiconductor device having radiation hardened insulators

Device structures with a self-aligned damage layer and methods for forming such device structures

Soft error protection structure employing a deep trench

Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors

Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit

Method for detecting alpha particles in SOI technology

CMOS storage devices configurable in high performance mode or radiation tolerant mode

Apparatus and method for hardening latches in SOI CMOS devices

Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors

Automatic exchange of degraders in accelerated testing of computer chips

CANNON ETHAN H

Structure and method for improving storage latch susceptibility to single event upsets

On-chip heater and methods for fabrication thereof and use thereof

Array of alpha particle sensors

Array of alpha particle sensors

In-line stacking of transistors for soft error rate hardening

Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiation

BOEING CO

Direct measurement test structures for measuring static random access memory static noise margin

Radiation hardened flip-flop circuit for mitigating single event transients

Method and apparatus for reducing radiation and cross-talk induced data errors

CABANAS-HOLMEN MANUEL F

Method and apparatus for reducing radiation and cross-talk induced data errors

BARTH JR JOHN E

Deep trench capacitor for SOI CMOS devices for soft error immunity