Inventor
OLDIGES PHILIP J
US50 patents
⚠️ This page may combine multiple inventors who share the name “OLDIGES PHILIP J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
40 patentsUS9853028B1Dec 26, 2017
Vertical FET with reduced parasitic capacitance
IBM33 citations94
US7348641B2Mar 25, 2008
Structure and method of making double-gated self-aligned finFET having gates of different lengths
IBM18 citations93
US6924517B2Aug 2, 2005
Thin channel FET with recessed source/drains and extensions
IBM23 citations93
US8361847B2Jan 29, 2013
Stressed channel FET with source/drain buffers
IBM16 citations92
US7365378B2Apr 29, 2008
MOSFET structure with ultra-low K spacer
IBM32 citations92
US7888959B2Feb 15, 2011
Apparatus and method for hardening latches in SOI CMOS devices
IBM11 citations84
US7220626B2May 22, 2007
Structure and method for manufacturing planar strained Si/SiGe substrate with multiple orientations and different stress levels
IBM10 citations84
US7627840B2Dec 1, 2009
Method for soft error modeling with double current pulse
IBM11 citations80
US7923782B2Apr 12, 2011
Hybrid SOI/bulk semiconductor transistors
IBM6 citations74
US7767503B2Aug 3, 2010
Hybrid SOI/bulk semiconductor transistors
IBM5 citations74
US7452761B2Nov 18, 2008
Hybrid SOI-bulk semiconductor transistors
IBM7 citations74
US7315075B2Jan 1, 2008
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
IBM8 citations74
US7064414B2Jun 20, 2006
Heater for annealing trapped charge in a semiconductor device
IBM10 citations74
US10297688B2May 21, 2019
Vertical field effect transistor with improved reliability
IBM2 citations73
US9583624B1Feb 28, 2017
Asymmetric finFET memory access transistor
IBM2 citations73
US9553173B1Jan 24, 2017
Asymmetric finFET memory access transistor
IBM5 citations73
US9515171B1Dec 6, 2016
Radiation tolerant device structure
IBM6 citations73
US10957780B2Mar 23, 2021
Non-uniform gate dielectric for U-shape MOSFET
IBM0 citations63
US10074652B1Sep 11, 2018
Vertical FET with reduced parasitic capacitance
IBM1 citations63
US7883944B2Feb 8, 2011
Ultra-thin semiconductor on insulator metal gate complementary field effect transistor with metal gate and method of forming thereof
IBM2 citations63
US7388274B2Jun 17, 2008
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
IBM4 citations63
US9064739B2Jun 23, 2015
Techniques for quantifying fin-thickness variation in FINFET technology
IBM3 citations62
US8940558B2Jan 27, 2015
Techniques for quantifying fin-thickness variation in FINFET technology
IBM2 citations62
US8921939B2Dec 30, 2014
Stressed channel FET with source/drain buffers
IBM3 citations62
US11152378B1Oct 19, 2021
Reducing error rates with alpha particle protection
IBM0 citations61
US8806419B2Aug 12, 2014
Apparatus for modeling of FinFET width quantization
IBM2 citations61
US8799848B1Aug 5, 2014
Methods for modeling of FinFET width quantization
IBM2 citations61
US10468524B2Nov 5, 2019
Vertical field effect transistor with improved reliability
IBM0 citations52
US10438949B2Oct 8, 2019
Vertical FET with reduced parasitic capacitance
IBM0 citations52
US10283504B2May 7, 2019
Vertical FET with reduced parasitic capacitance
IBM0 citations52
US10256319B2Apr 9, 2019
Non-uniform gate dielectric for U-shape MOSFET
IBM0 citations52
US8993395B2Mar 31, 2015
Minimizing leakage current and junction capacitance in CMOS transistors by utilizing dielectric spacers
IBM0 citations52
US8354858B2Jan 15, 2013
Apparatus and method for hardening latches in SOI CMOS devices
IBM0 citations52
US8354720B2Jan 15, 2013
Embedded stressor for semiconductor structures
IBM0 citations52
US8053317B2Nov 8, 2011
Method and structure for improving uniformity of passive devices in metal gate technology
IBM1 citations52
US7791169B2Sep 7, 2010
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
IBM0 citations52
US7785944B2Aug 31, 2010
Method of making double-gated self-aligned finFET having gates of different lengths
IBM1 citations52
US7691482B2Apr 6, 2010
Structure for planar SOI substrate with multiple orientations
IBM1 citations52
US9058441B2Jun 16, 2015
Methods for modeling of FinFET width quantization
IBM0 citations51
US9034715B2May 19, 2015
Method and structure for dielectric isolation in a fin field effect transistor
IBM1 citations49