Inventor

JINGU TAKAHIRO

JP66 patents

⚠️ This page may combine multiple inventors who share the name “JINGU TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JINGU TAKAHIRO

HITACHI HIGH TECH CORP

Method for inspecting defect and apparatus for inspecting defect

Apparatus and method for testing defects

Apparatus and method for testing defects

Inspection method and inspection apparatus

Method of apparatus for detecting particles on a specimen

Inspection method and inspection device

Defects inspecting apparatus and defects inspecting method

Method and its apparatus for inspecting particles or defects of a semiconductor device

Mini environment apparatus, inspection apparatus, manufacturing apparatus and cleaning method of space

Method for inspecting defect and apparatus for inspecting defect

Method for inspecting defect and apparatus for inspecting defect

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method and its apparatus for inspecting particles or defects of a semiconductor device

Defect inspection device and defect inspection method

Defect inspection device and defect inspection method

Method of apparatus for detecting particles on a specimen

Defects inspecting apparatus and defects inspecting method

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method of apparatus for detecting particles on a specimen

Charged particle beam device

Sample for coordinates calibration and method for fabricating the same

Defect inspection method, low light detecting method, and low light detector

Surface measurement apparatus

Inspection device and image capture element

Inspection device

Inspection device

Defect inspection device and defect inspection method

Surface-defect inspection device

HITACHI LTD

Optical apparatus for defect and particle size inspection

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method of detecting defects on an object

System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value

Defect detector and defect detecting method

Method and its apparatus for inspecting particles or defects of a semiconductor device

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method of inspecting foreign particle or defect on a sample

Method and its apparatus for inspecting particles or defects of a semiconductor device

TAKAHASHI KAZUO

Inspection apparatus and inspection method

Surface shape measuring apparatus

HAMAMATSU AKIRA

Inspection method and inspection apparatus

Method of apparatus for detecting particles on a specimen

NEMOTO KAZUNORI

Inspecting apparatus and an inspecting method

HORAI IZUO

Inspection method and inspection device

ITO MASAAKI

Apparatus for inspecting defect with time/spatial division optical system

URANO YUTA

Defect inspection method, low light detecting method and low light detector

SUZUKI KATSUYA

Surface-defect inspection device

UTO SACHIO

Defects inspecting apparatus and defects inspecting method

JINGU TAKAHIRO

Examination method and examination device