Inventor
UPPALURI PRASANTI
US15 patents
⚠️ This page may combine multiple inventors who share the name “UPPALURI PRASANTI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
6 patentsUS10267748B2Apr 23, 2019
Optimizing training sets used for setting up inspection-related algorithms
KLA TENCOR CORP12 citations80
US10209628B2Feb 19, 2019
System and method for defect classification based on electrical design intent
KLA TENCOR CORP1 citations58
US11237119B2Feb 1, 2022
Diagnostic methods for the classifiers and the defects captured by optical tools
KLA TENCOR CORP0 citations49
US10706522B2Jul 7, 2020
System and method for generation of wafer inspection critical areas
KLA TENCOR CORP0 citations47
US10670536B2Jun 2, 2020
Mode selection for inspection
KLA TENCOR CORP0 citations40
US10620134B2Apr 14, 2020
Creating defect samples for array regions
KLA TENCOR CORP0 citations35
KLA CORP
6 patentsUS11379967B2Jul 5, 2022
Methods and systems for inspection of semiconductor structures with automatically generated defect features
KLA CORP2 citations70
US11676264B2Jun 13, 2023
System and method for determining defects using physics-based image perturbations
KLA CORP3 citations67
US11379969B2Jul 5, 2022
Method for process monitoring with optical inspections
KLA CORP0 citations62
US12299848B2May 13, 2025
Deep learning image denoising for semiconductor-based applications
KLA CORP1 citations60
US11114324B2Sep 7, 2021
Defect candidate generation for inspection
KLA CORP0 citations59
US11410291B2Aug 9, 2022
System and method for generation of wafer inspection critical areas
KLA CORP0 citations57