Inventor
BEHA JOHANNES G
CH12 patents
Patents
12 patentsUS4868492ASep 19, 1989
Method for contactless testing of conducting paths in a substrate using photo-assisted tunneling
IBM48 citations94
US5008878AApr 16, 1991
High-speed modular switching apparatus for circuit and packet switched traffic
IBM86 citations93
US4845425AJul 4, 1989
Full chip integrated circuit tester
IBM25 citations92
US4786864ANov 22, 1988
Photon assisted tunneling testing of passivated integrated circuits
IBM26 citations92
US4706018ANov 10, 1987
Noncontact dynamic tester for integrated circuits
IBM47 citations92
US4703260AOct 27, 1987
Full chip integrated circuit tester
IBM37 citations92
US4999577AMar 12, 1991
Method for contactless testing of conducting paths in a substrate using photon-assisted tunneling
IBM44 citations91
US4843329AJun 27, 1989
Method for contactless testing for electrical opens and short circuits in conducting paths in a substrate
IBM50 citations91
US4918309AApr 17, 1990
Method for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said method
IBM24 citations89
US4670710AJun 2, 1987
Noncontact full-line dynamic AC tester for integrated circuits
IBM10 citations73
US4644264AFeb 17, 1987
Photon assisted tunneling testing of passivated integrated circuits
IBM20 citations73
US4525730AJun 25, 1985
Buried junction Josephson interferometer
IBM4 citations62