P

Inventor

SUZUKI NAOMASA

JP54 patents
⚠️ This page may combine multiple inventors who share the name “SUZUKI NAOMASA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

26 patents
US7462828B2Dec 9, 2008

Inspection method and inspection system using charged particle beam

HITACHI HIGH TECH CORP18 citations92
US7449690B2Nov 11, 2008

Inspection method and inspection apparatus using charged particle beam

HITACHI HIGH TECH CORP28 citations92
US6765205B2Jul 20, 2004

Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same

HITACHI HIGH TECH CORP37 citations92
US9659744B2May 23, 2017

Charged particle beam apparatus and inspection method using the same

HITACHI HIGH TECH CORP7 citations84
US7888640B2Feb 15, 2011

Scanning electron microscope and method of imaging an object by using the scanning electron microscope

HITACHI HIGH TECH CORP9 citations84
US7557347B2Jul 7, 2009

Charged particle beam apparatus, scanning electron microscope, and sample observation method using the same

HITACHI HIGH TECH CORP11 citations84
US10879037B2Dec 29, 2020

Charged particle beam device with distance setting between irradiation regions in a scan line

HITACHI HIGH TECH CORP8 citations83
US7875849B2Jan 25, 2011

Electron beam apparatus and electron beam inspection method

HITACHI HIGH TECH CORP7 citations83
US9704687B2Jul 11, 2017

Charged particle beam application device

HITACHI HIGH TECH CORP5 citations73
US10832886B2Nov 10, 2020

Beam irradiation device

HITACHI HIGH TECH CORP3 citations72
US10269536B2Apr 23, 2019

Electron microscope

HITACHI HIGH TECH CORP4 citations72
US10121632B2Nov 6, 2018

Charged particle beam apparatus

HITACHI HIGH TECH CORP2 citations72
US9644955B2May 9, 2017

Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using same

HITACHI HIGH TECH CORP2 citations72
US9324540B2Apr 26, 2016

Charged particle beam device

HITACHI HIGH TECH CORP3 citations72
US9653256B2May 16, 2017

Charged particle-beam device

HITACHI HIGH TECH CORP4 citations71
US9287084B2Mar 15, 2016

Aberration corrector and charged particle beam apparatus using the same

HITACHI HIGH TECH CORP3 citations71
US11852599B2Dec 26, 2023

Image processing system

HITACHI HIGH TECH CORP0 citations62
US11211224B2Dec 28, 2021

Charged particle beam apparatus

HITACHI HIGH TECH CORP0 citations62
US9159533B2Oct 13, 2015

Charged particle beam apparatus permitting high-resolution and high-contrast observation

HITACHI HIGH TECH CORP1 citations62
US8785890B2Jul 22, 2014

Charged particle beam apparatus permitting high-resolution and high-contrast observation

HITACHI HIGH TECH CORP2 citations62
US7619219B2Nov 17, 2009

Scanning electron microscope

HITACHI HIGH TECH CORP4 citations62
US7504626B2Mar 17, 2009

Scanning electron microscope and apparatus for detecting defect

HITACHI HIGH TECH CORP3 citations62
US11239042B2Feb 1, 2022

Beam irradiation device

HITACHI HIGH TECH CORP0 citations61
US10971328B2Apr 6, 2021

Charged particle beam device

HITACHI HIGH TECH CORP0 citations59
US10734191B2Aug 4, 2020

Charged particle beam device

HITACHI HIGH TECH CORP1 citations59
US9287082B2Mar 15, 2016

Charged particle beam apparatus

HITACHI HIGH TECH CORP0 citations52

HITACHI LTD

10 patents
US6847038B2Jan 25, 2005

Scanning electron microscope

HITACHI LTD74 citations98
US6646262B1Nov 11, 2003

Scanning electron microscope

HITACHI LTD57 citations96
US5731580AMar 24, 1998

Scanning electron microscope

HITACHI LTD19 citations93
US6555819B1Apr 29, 2003

Scanning electron microscope

HITACHI LTD19 citations92
US5903004AMay 11, 1999

Energy dispersive X-ray analyzer

HITACHI LTD44 citations92
US7049591B2May 23, 2006

Scanning electron microscope

HITACHI LTD11 citations84
US6025593AFeb 15, 2000

Scanning electron microscope

HITACHI LTD16 citations84
US7399966B2Jul 15, 2008

Scanning electron microscope

HITACHI LTD6 citations74
US7294835B2Nov 13, 2007

Scanning electron microscope

HITACHI LTD3 citations63
US6979821B2Dec 27, 2005

Scanning electron microscope

HITACHI LTD2 citations62

FUKUDA MUNEYUKI

6 patents
US8841612B2Sep 23, 2014

Charged particle beam microscope

FUKUDA MUNEYUKI12 citations83
US8389935B2Mar 5, 2013

Charged particle beam apparatus permitting high-resolution and high-contrast observation

FUKUDA MUNEYUKI7 citations83
US9123501B2Sep 1, 2015

Device for correcting diffraction aberration of electron beam

FUKUDA MUNEYUKI4 citations73
US8431915B2Apr 30, 2013

Charged particle beam apparatus permitting high resolution and high-contrast observation

FUKUDA MUNEYUKI4 citations73
US8431893B2Apr 30, 2013

Electron beam apparatus and electron beam inspection method

FUKUDA MUNEYUKI4 citations61
US8207498B2Jun 26, 2012

Electron beam apparatus and electron beam inspection method

FUKUDA MUNEYUKI4 citations61

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

2 patents
US6124699ASep 26, 2000

Battery charger device

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD197 citations97
US7359506B2Apr 15, 2008

Opening and closing device and electronic equipment using the same

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD3 citations62

FUKADA ATSUKO

1 patent
US8153969B2Apr 10, 2012

Inspection method and inspection system using charged particle beam

FUKADA ATSUKO16 citations89

TAKADA SATOSHI

1 patent
US8519334B2Aug 27, 2013

Scanning electron microscope and sample observation method

TAKADA SATOSHI16 citations76

TSUJI HIROSHI

1 patent
US8629410B2Jan 14, 2014

Charged particle radiation device

TSUJI HIROSHI2 citations60

TAKAHASHI NORITSUGU

1 patent
US8467595B2Jun 18, 2013

Defect review system and method, and program

TAKAHASHI NORITSUGU4 citations57

SHOJO TOMOYASU

1 patent
US8405026B2Mar 26, 2013

Charged particle beam apparatus

SHOJO TOMOYASU2 citations56

TACHIBANA ICHIRO

1 patent
US8222601B2Jul 17, 2012

Scanning electron microscope and method of imaging an object by using the scanning electron microscope

TACHIBANA ICHIRO2 citations56

Showing the top 50 of 54 patents by PatentIndex Score.