P

Inventor

MARAKHTANOV ALEXEI

US98 patents
⚠️ This page may combine multiple inventors who share the name “MARAKHTANOV ALEXEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LAM RES CORP

38 patents
US9852889B1Dec 26, 2017

Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring

LAM RES CORP135 citations99
US10115568B2Oct 30, 2018

Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring

LAM RES CORP57 citations98
US9536749B2Jan 3, 2017

Ion energy control by RF pulse shape

LAM RES CORP69 citations98
US7758764B2Jul 20, 2010

Methods and apparatus for substrate processing

LAM RES CORP76 citations98
US9595424B2Mar 14, 2017

Impedance matching circuit for operation with a kilohertz RF generator and a megahertz RF generator to control plasma processes

LAM RES CORP50 citations96
US10026592B2Jul 17, 2018

Systems and methods for tailoring ion energy distribution function by odd harmonic mixing

LAM RES CORP37 citations94
US9761414B2Sep 12, 2017

Uniformity control circuit for use within an impedance matching circuit

LAM RES CORP38 citations94
US10504744B1Dec 10, 2019

Three or more states for achieving high aspect ratio dielectric etch

LAM RES CORP25 citations93
US9620334B2Apr 11, 2017

Control of etch rate using modeling, feedback and impedance match

LAM RES CORP20 citations93
US9337000B2May 10, 2016

Control of impedance of RF return path

LAM RES CORP32 citations93
US7837826B2Nov 23, 2010

Hybrid RF capacitively and inductively coupled plasma source using multifrequency RF powers and methods of use thereof

LAM RES CORP22 citations93
US9401264B2Jul 26, 2016

Control of impedance of RF delivery path

LAM RES CORP22 citations92
US7994794B2Aug 9, 2011

Methods for measuring a set of electrical characteristics in a plasma

LAM RES CORP15 citations92
US7723994B2May 25, 2010

Plasma processing chamber with an apparatus for measuring a set of electrical characteristics in a plasma

LAM RES CORP16 citations92
US7479207B2Jan 20, 2009

Adjustable height PIF probe

LAM RES CORP17 citations92
US10283330B2May 7, 2019

Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators

LAM RES CORP14 citations86
US11335539B2May 17, 2022

Systems and methods for optimizing power delivery to an electrode of a plasma chamber

LAM RES CORP6 citations85
US11195706B2Dec 7, 2021

Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators

LAM RES CORP7 citations84
US10615003B2Apr 7, 2020

Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring

LAM RES CORP9 citations84
US10340122B2Jul 2, 2019

Systems and methods for tailoring ion energy distribution function by odd harmonic mixing

LAM RES CORP7 citations84
US10002746B1Jun 19, 2018

Multi regime plasma wafer processing to increase directionality of ions

LAM RES CORP8 citations84
US9793126B2Oct 17, 2017

Ion to neutral control for wafer processing with dual plasma source reactor

LAM RES CORP18 citations84
US7837827B2Nov 23, 2010

Edge ring arrangements for substrate processing

LAM RES CORP12 citations84
US7578301B2Aug 25, 2009

Methods and apparatus for determining the endpoint of a cleaning or conditioning process in a plasma processing system

LAM RES CORP14 citations84
US10249476B2Apr 2, 2019

Control of impedance of RF return path

LAM RES CORP12 citations83
US10157730B2Dec 18, 2018

Control of impedance of RF delivery path

LAM RES CORP6 citations83
US9984859B2May 29, 2018

Impedance matching circuit for operation with a kilohertz RF generator and a megahertz RF generator to control plasma processes

LAM RES CORP15 citations82
US11594400B2Feb 28, 2023

Multi zone gas injection upper electrode system

LAM RES CORP6 citations74
US7319316B2Jan 15, 2008

Apparatus for measuring a set of electrical characteristics in a plasma

LAM RES CORP8 citations74
US11908660B2Feb 20, 2024

Systems and methods for optimizing power delivery to an electrode of a plasma chamber

LAM RES CORP2 citations73
US11670486B2Jun 6, 2023

Pulsed plasma chamber in dual chamber configuration

LAM RES CORP2 citations73
US11651991B2May 16, 2023

Electrostatic Chuck design for cooling-gas light-up prevention

LAM RES CORP2 citations73
US11069553B2Jul 20, 2021

Electrostatic chuck with features for preventing electrical arcing and light-up and improving process uniformity

LAM RES CORP2 citations73
US11024532B2Jun 1, 2021

Electrostatic chuck design for cooling-gas light-up prevention

LAM RES CORP1 citations73
US10916409B2Feb 9, 2021

Active control of radial etch uniformity

LAM RES CORP2 citations73
US10825656B2Nov 3, 2020

Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring

LAM RES CORP2 citations73
US10755895B2Aug 25, 2020

Ion energy control by RF pulse shape

LAM RES CORP3 citations73
US10593516B2Mar 17, 2020

Multi-radiofrequency impedance control for plasma uniformity tuning

LAM RES CORP3 citations73

DHINDSA RAJINDER

5 patents

KELLOGG MICHAEL C

2 patents

MKS INSTR INC

2 patents

NAM SANG KI

1 patent

PATRICK ROGER

1 patent

BETTENCOURT GREG

1 patent

Showing the top 50 of 98 patents by PatentIndex Score.