Inventor
MARAKHTANOV ALEXEI
US98 patents
⚠️ This page may combine multiple inventors who share the name “MARAKHTANOV ALEXEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LAM RES CORP
38 patentsUS9852889B1Dec 26, 2017
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP135 citations99
US10115568B2Oct 30, 2018
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP57 citations98
US9536749B2Jan 3, 2017
Ion energy control by RF pulse shape
LAM RES CORP69 citations98
US7758764B2Jul 20, 2010
Methods and apparatus for substrate processing
LAM RES CORP76 citations98
US9595424B2Mar 14, 2017
Impedance matching circuit for operation with a kilohertz RF generator and a megahertz RF generator to control plasma processes
LAM RES CORP50 citations96
US10026592B2Jul 17, 2018
Systems and methods for tailoring ion energy distribution function by odd harmonic mixing
LAM RES CORP37 citations94
US9761414B2Sep 12, 2017
Uniformity control circuit for use within an impedance matching circuit
LAM RES CORP38 citations94
US10504744B1Dec 10, 2019
Three or more states for achieving high aspect ratio dielectric etch
LAM RES CORP25 citations93
US9620334B2Apr 11, 2017
Control of etch rate using modeling, feedback and impedance match
LAM RES CORP20 citations93
US9337000B2May 10, 2016
Control of impedance of RF return path
LAM RES CORP32 citations93
US7837826B2Nov 23, 2010
Hybrid RF capacitively and inductively coupled plasma source using multifrequency RF powers and methods of use thereof
LAM RES CORP22 citations93
US9401264B2Jul 26, 2016
Control of impedance of RF delivery path
LAM RES CORP22 citations92
US7994794B2Aug 9, 2011
Methods for measuring a set of electrical characteristics in a plasma
LAM RES CORP15 citations92
US7723994B2May 25, 2010
Plasma processing chamber with an apparatus for measuring a set of electrical characteristics in a plasma
LAM RES CORP16 citations92
US7479207B2Jan 20, 2009
Adjustable height PIF probe
LAM RES CORP17 citations92
US10283330B2May 7, 2019
Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators
LAM RES CORP14 citations86
US11335539B2May 17, 2022
Systems and methods for optimizing power delivery to an electrode of a plasma chamber
LAM RES CORP6 citations85
US11195706B2Dec 7, 2021
Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators
LAM RES CORP7 citations84
US10615003B2Apr 7, 2020
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP9 citations84
US10340122B2Jul 2, 2019
Systems and methods for tailoring ion energy distribution function by odd harmonic mixing
LAM RES CORP7 citations84
US10002746B1Jun 19, 2018
Multi regime plasma wafer processing to increase directionality of ions
LAM RES CORP8 citations84
US9793126B2Oct 17, 2017
Ion to neutral control for wafer processing with dual plasma source reactor
LAM RES CORP18 citations84
US7837827B2Nov 23, 2010
Edge ring arrangements for substrate processing
LAM RES CORP12 citations84
US7578301B2Aug 25, 2009
Methods and apparatus for determining the endpoint of a cleaning or conditioning process in a plasma processing system
LAM RES CORP14 citations84
US10249476B2Apr 2, 2019
Control of impedance of RF return path
LAM RES CORP12 citations83
US10157730B2Dec 18, 2018
Control of impedance of RF delivery path
LAM RES CORP6 citations83
US9984859B2May 29, 2018
Impedance matching circuit for operation with a kilohertz RF generator and a megahertz RF generator to control plasma processes
LAM RES CORP15 citations82
US11594400B2Feb 28, 2023
Multi zone gas injection upper electrode system
LAM RES CORP6 citations74
US7319316B2Jan 15, 2008
Apparatus for measuring a set of electrical characteristics in a plasma
LAM RES CORP8 citations74
US11908660B2Feb 20, 2024
Systems and methods for optimizing power delivery to an electrode of a plasma chamber
LAM RES CORP2 citations73
US11670486B2Jun 6, 2023
Pulsed plasma chamber in dual chamber configuration
LAM RES CORP2 citations73
US11651991B2May 16, 2023
Electrostatic Chuck design for cooling-gas light-up prevention
LAM RES CORP2 citations73
US11069553B2Jul 20, 2021
Electrostatic chuck with features for preventing electrical arcing and light-up and improving process uniformity
LAM RES CORP2 citations73
US11024532B2Jun 1, 2021
Electrostatic chuck design for cooling-gas light-up prevention
LAM RES CORP1 citations73
US10916409B2Feb 9, 2021
Active control of radial etch uniformity
LAM RES CORP2 citations73
US10825656B2Nov 3, 2020
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP2 citations73
US10755895B2Aug 25, 2020
Ion energy control by RF pulse shape
LAM RES CORP3 citations73
US10593516B2Mar 17, 2020
Multi-radiofrequency impedance control for plasma uniformity tuning
LAM RES CORP3 citations73
DHINDSA RAJINDER
5 patentsUS8652298B2Feb 18, 2014
Triode reactor design with multiple radiofrequency powers
DHINDSA RAJINDER160 citations98
US8563619B2Oct 22, 2013
Methods and arrangements for plasma processing system with tunable capacitance
DHINDSA RAJINDER29 citations93
US8211324B2Jul 3, 2012
Methods and arrangements for controlling plasma processing parameters
DHINDSA RAJINDER29 citations93
US8450635B2May 28, 2013
Method and apparatus for inducing DC voltage on wafer-facing electrode
DHINDSA RAJINDER7 citations84
US9536711B2Jan 3, 2017
Method and apparatus for DC voltage control on RF-powered electrode
DHINDSA RAJINDER14 citations83
KELLOGG MICHAEL C
2 patentsMKS INSTR INC
2 patentsNAM SANG KI
1 patentPATRICK ROGER
1 patentBETTENCOURT GREG
1 patentShowing the top 50 of 98 patents by PatentIndex Score.