Inventor

NAKAJIMA KEN

JP72 patents

⚠️ This page may combine multiple inventors who share the name “NAKAJIMA KEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAKAJIMA KEN

SONY CORP

Imaging apparatus for performing selective processing of image data

Imaging apparatus

Image processing apparatus and method, recording medium, and program

Image pick-up device and image pick-up method adapted with image pick-up sensitivity

Apparatus and method for image processing and storage medium for the same

Image processing apparatus and method, and recording medium therefor

Imaging apparatus in which reduced resolution image data is generated, and when supplied over an image data bus, the resolution is increased and outputted

Camera signal processing apparatus and camera signal processing method

Imaging apparatus

Image processing apparatus and method, recording medium, and program

Image pickup device and chromatic aberration correction method

Imaging apparatus with higher and lower resolution converters and a compression unit to compress decreased resolution image data

Imager including a solid state imaging device with optical low pass filter

Solid-state image pickup device and drive method thereof

Image processing system, image processing method, image processing recording medium, and program suitable for extraction processing

Interpolation process for an image processing apparatus

Imaging apparatus with delay and processor to weight lines of delayed image data

Distance calculating method and imaging device

Imager and image quality correcting method performing correction based on the output of different readout modes

Face detection device, imaging apparatus, and face detection method

Gamma correction circuit

Image capturing apparatus, imaging circuit, and image capturing method

Imaging apparatus, imaging circuit and imaging method

Image device and method for removing noise

Image data correcting method and imaging device

Image processing method for computing limit values of interpolated pixel data

Method and apparatus for reducing image noise

NEC CORP

Electron beam writing method

Pattern exposure method using electron beam

Variable shaped electron beam exposure system and method of writing a pattern by a variable shaped electron beam

Method of writing any patterns on a resist by an electron beam exposure and electron beam exposure system

Method of extracting a mask pattern for an electron beam exposure

Method of drawing patterns through electron beam exposure utilizing target subpatterns and varied exposure quantity

Mask data generating method and mask for an electron beam exposure system

Method of transferring miniature pattern by using electron beam lithography system without proximity effect

Electron beam exposure apparatus with improved drawing precision

Electron beam lithographing method and apparatus thereof

Method of manufacturing an EB mask for electron beam image drawing and device for manufacturing an EB mask

EBARA CORP

Method of and apparatus for producing ozonized water

Process and system for purifying pure water or ultrapure water

Ultraviolet reactor with mixing baffle plates

Process for removing dissolved oxygen from water and system therefor

OKADA MIYUKI

Face detection device, imaging apparatus, and face detection method

Face detection device, imaging apparatus, and face detection method

MITSUBISHI MATERIAL SILICON

Epitaxial wafer and a method for manufacturing the same

(unassigned)

Sea-land-sky craft

ZOJIRUSHI CORP

Water bottle pouch

MATSUSHITA NOBUYUKI

Generating full color images by demosaicing noise removed pixels from images

SUMCO CORP

Process for producing silicon single crystal

NEC ELECTRONICS CORP

Pattern exposure method and apparatus