Inventor
LIAO JIUNN-HSIUNG
TW72 patents
⚠️ This page may combine multiple inventors who share the name “LIAO JIUNN-HSIUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
34 patentsUS7544623B2Jun 9, 2009
Method for fabricating a contact hole
UNITED MICROELECTRONICS CORP21 citations90
US9741614B1Aug 22, 2017
Method of preventing trench distortion
UNITED MICROELECTRONICS CORP12 citations84
US7799511B2Sep 21, 2010
Method of forming a contact hole
UNITED MICROELECTRONICS CORP10 citations84
US7517766B2Apr 14, 2009
Method of removing a spacer, method of manufacturing a metal-oxide-semiconductor transistor device, and metal-oxide-semiconductor transistor device
UNITED MICROELECTRONICS CORP12 citations84
US7432194B2Oct 7, 2008
Etching method and method for forming contact opening
UNITED MICROELECTRONICS CORP9 citations84
US8952451B2Feb 10, 2015
Semiconductor device having metal gate and manufacturing method thereof
UNITED MICROELECTRONICS CORP5 citations83
US10903269B2Jan 26, 2021
Magnetic memory device and fabrication method thereof
UNITED MICROELECTRONICS CORP4 citations73
US10109525B1Oct 23, 2018
Fabrication method and structure of semiconductor device with contact and plug
UNITED MICROELECTRONICS CORP5 citations73
US9779942B1Oct 3, 2017
Method of forming patterned mask layer
UNITED MICROELECTRONICS CORP3 citations73
US10636744B2Apr 28, 2020
Memory device including alignment mark trench
UNITED MICROELECTRONICS CORP2 citations72
US9023708B2May 5, 2015
Method of forming semiconductor device
UNITED MICROELECTRONICS CORP6 citations72
US7767578B2Aug 3, 2010
Damascene interconnection structure and dual damascene process thereof
UNITED MICROELECTRONICS CORP5 citations72
US7868390B2Jan 11, 2011
Method for fabricating strained-silicon CMOS transistor
UNITED MICROELECTRONICS CORP2 citations63
US7615434B2Nov 10, 2009
CMOS device and fabricating method thereof
UNITED MICROELECTRONICS CORP4 citations63
US6736146B2May 18, 2004
Method of rapidly reworking color filters
UNITED MICROELECTRONICS CORP3 citations63
US12349367B2Jul 1, 2025
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11785785B2Oct 10, 2023
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11545522B2Jan 3, 2023
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11283007B2Mar 22, 2022
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11271154B2Mar 8, 2022
Magnetic tunnel junction (MTJ) device
UNITED MICROELECTRONICS CORP0 citations62
US11121307B2Sep 14, 2021
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11056536B2Jul 6, 2021
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US10847709B1Nov 24, 2020
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP1 citations62
US7851370B2Dec 14, 2010
Patterning method
UNITED MICROELECTRONICS CORP4 citations62
US7592265B2Sep 22, 2009
Method of trimming a hard mask layer, method for fabricating a gate in a MOS transistor, and a stack for fabricating a gate in a MOS transistor
UNITED MICROELECTRONICS CORP6 citations62
US7977244B2Jul 12, 2011
Semiconductor manufacturing process
UNITED MICROELECTRONICS CORP6 citations61
US7378341B2May 27, 2008
Automatic process control of after-etch-inspection critical dimension
UNITED MICROELECTRONICS CORP2 citations60
US7445726B2Nov 4, 2008
Photoresist trimming process
UNITED MICROELECTRONICS CORP2 citations54
US10804138B2Oct 13, 2020
Method for fabricating a semiconductor device
UNITED MICROELECTRONICS CORP0 citations52
US10699913B2Jun 30, 2020
Manufacturing method for trench
UNITED MICROELECTRONICS CORP0 citations52
US9620369B2Apr 11, 2017
Method for fabricating semiconductor device to integrate transistor with passive device
UNITED MICROELECTRONICS CORP0 citations51
US9312258B2Apr 12, 2016
Strained silicon structure
UNITED MICROELECTRONICS CORP1 citations51
US9165997B2Oct 20, 2015
Semiconductor process
UNITED MICROELECTRONICS CORP1 citations51
US8999830B2Apr 7, 2015
Semiconductor device having metal gate and manufacturing method thereof
UNITED MICROELECTRONICS CORP0 citations51
HWANG GUANG-YAW
3 patentsUS9384962B2Jul 5, 2016
Oxygen treatment of replacement work-function metals in CMOS transistor gates
HWANG GUANG-YAW7 citations82
US8310012B2Nov 13, 2012
Semiconductor device having metal gate and manufacturing method thereof
HWANG GUANG-YAW16 citations82
US8552503B2Oct 8, 2013
Strained silicon structure
HWANG GUANG-YAW6 citations81
LIAO PO-JUI
2 patentsCHANG FENG-YI
2 patentsCHOU PEI-YU
2 patentsKUO LUNG-EN
2 patentsCHEN SHIN-CHI
1 patentCHEN CHIEH-TE
1 patentTSAO PO-CHAO
1 patentLEE CHANG-HSIAO
1 patentWANG CHIEH-JU
1 patentShowing the top 50 of 72 patents by PatentIndex Score.