Inventor
CHOI CHANGHOON
US17 patents
⚠️ This page may combine multiple inventors who share the name “CHOI CHANGHOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QUANTUM SI INC
8 patentsUS11573180B2Feb 7, 2023
Integrated sensor with reduced skew
QUANTUM SI INC5 citations84
US11869917B2Jan 9, 2024
Integrated sensor for lifetime characterization
QUANTUM SI INC3 citations75
US11719639B2Aug 8, 2023
Integrated sensor for multi-dimensional signal analysis
QUANTUM SI INC2 citations73
US12300711B2May 13, 2025
Integrated sensor for lifetime characterization
QUANTUM SI INC0 citations62
US12203855B2Jan 21, 2025
Sensor for lifetime plus spectral characterization
QUANTUM SI INC0 citations62
US11885744B2Jan 30, 2024
Sensor for lifetime plus spectral characterization
QUANTUM SI INC1 citations62
US12188870B2Jan 7, 2025
Integrated sensor with reduced skew
QUANTUM SI INC0 citations61
US12092579B2Sep 17, 2024
Integrated sensor with reduced skew
QUANTUM SI INC0 citations61
SAMSUNG ELECTRONICS CO LTD
6 patentsUS9960944B2May 1, 2018
Receiving apparatus and decoding method thereof
SAMSUNG ELECTRONICS CO LTD7 citations83
US12045009B2Jul 23, 2024
Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM
SAMSUNG ELECTRONICS CO LTD0 citations60
US11314205B2Apr 26, 2022
Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM
SAMSUNG ELECTRONICS CO LTD0 citations60
US12593138B2Mar 31, 2026
Image signal processor and method of processing images
SAMSUNG ELECTRONICS CO LTD0 citations48
US12481144B2Nov 25, 2025
EUV photomask inspection apparatus
SAMSUNG ELECTRONICS CO LTD0 citations47
US12561788B2Feb 24, 2026
Fluorescence microscopy metrology system and method of operating fluorescence microscopy metrology system
SAMSUNG ELECTRONICS CO LTD0 citations41